High density low cost wideband production RF test instrument architecture

• US 10,469,181 B2
• Filed: 05/31/2018
• Issued: 11/05/2019
• Est. Priority Date: 06/02/2017
• Status: Active Grant

• Current Assignee: Intel Corporation
• Original Assignee: Intel Corporation
• Inventors: Pan, Jin, Acar, Erkan, Sturges, Stephen S.
• Primary Examiner(s): Urban, Edward F
• Assistant Examiner(s): Mathew, Max
• Application Number:
  US15/993,890
• Publication Number:
  US 20180351662A1
• Time in Patent Office: 523 Days
• Field of Search: 455 6711
• CPC Class Codes: H04B 17/15 Performance testing
• CPC Class Codes: H04B 17/29 Performance testing

Abstract

A test apparatus and method of testing a DUT are described. The apparatus includes a receiver and transmitter path each having a pair of switches that switch between a bypass position and a direct position. The bypass position is used for low frequency signals communicated through the apparatus. The direct position allows higher frequency signals to be double converted by upconversion to an IF signal and bandpass filtered before being downconverted to a predetermined frequency. Both variable and fixed LO signals are used to convert the double converted signals so that the same IF may be used independent of the higher frequency signal received or transmitted. Bandpass filtering is applied before and after amplification of the IF signal. Lowpass filtering before and after the double conversion use LPFs of different cutoff frequencies.

Claims

1. An apparatus of a testing device, comprising:

a receiver path of the testing device comprising;

a pair of receiver switches, the receiver path configured to set the receiver switches in a receiver bypass position for reception of a signal from a device under test (DUT) of at most a first predetermined frequency and in a receiver direct position for reception of a signal of more than the first predetermined frequency; and

first double conversion circuitry to which the signal of more than the first predetermined frequency is introduced and that is configured to convert the signal of more than the first predetermined frequency to a signal of the first predetermined frequency, the signal of the first predetermined frequency and the signal of at most the first predetermined frequency supplied to one of the receiver switches; and

a transmitter path comprising a pair of transmitter switches in a transmitter bypass position for transmission of a signal to the DUT of at most the first predetermined frequency and in a transmitter direct position for transmission of a signal of more than the first predetermined frequency through second double conversion circuitry that is configured to convert the signal of more than the first predetermined frequency to the signal of the first predetermined frequency, the signal of at most the first predetermined frequency and the signal of more than the first predetermined frequency supplied to one of the transmitter switches.

2. The apparatus of claim 1, wherein:

the receiver path further comprises receiver front end amplification circuitry, an analog-to-digital converter (ADC) and first and second receiver lowpass filters (LPFs), the first receiver LPF connected between a first of the receiver pair of switches and the DUT, the second receiver LPF connected between a second of the receiver pair of switches and the ADC, the first of the receiver pair of switches more proximate than the second of the receiver pair of switches to the receiver front end amplification circuitry, and

the transmitter path further comprises transmitter front end amplification circuitry, a digital-to-analog converter (DAC) and first and second transmitter LPFs, the first transmitter LPF connected between a first of the transmitter pair of switches and the DUT, the second transmitter LPF connected between a second of the transmitter pair of switches and the DAC, the first of the transmitter pair of switches more proximate than the transmitter of the receiver pair of switches to the transmitter front end amplification circuitry.

3. The apparatus of claim 2, wherein:

the receiver front end amplification circuitry and transmitter front end amplification circuitry are the same amplification circuitry,

the first and second receiver LPFs and first and second transmitter LPFs, respectively, are the same LPFs, and

the receiver pair of switches and transmitter pair of switches are the same pair of switches.

4. The apparatus of claim 2, wherein:

the first receiver and transmitter LPFs have a cutoff frequency respectively higher than that of the second receiver and transmitter LPFs.

5. The apparatus of claim 4, wherein:

the cutoff frequency of the second receiver and transmitter LPFs is about the first predetermined frequency plus a maximum bandwidth of the signal from the DUT.

6. The apparatus of claim 5, wherein:

the cutoff frequency of the first receiver and transmitter LPFs is about 13 GHz or 16 GHz, and

the cutoff frequency of the second receiver and transmitter LPFs is about 5 GHz.

7. The apparatus of claim 1, wherein:

the signal of the first predetermined frequency is supplied to the second of the receiver and transmitter switches,

each of the first and second double conversion circuitry comprises a pair of mixers and a pair of bandpass filters (BPFs) connected between the pair of mixers and an amplifier connected between the pair of BPFs,

the pair of mixers in the first double conversion circuitry is configured to upconvert the signal of more than the first predetermined frequency to a second predetermined frequency and downconvert the signal of the second predetermined frequency to a third predetermined frequency, and

the pair of mixers in the second double conversion circuitry is configured to upconvert the signal of the third first predetermined frequency to the second predetermined frequency and downconvert the signal of the second predetermined frequency to the more than the first predetermined frequency.

8. The apparatus of claim 7, wherein:

the third predetermined frequency is the first predetermined frequency.

9. The apparatus of claim 7, wherein:

each pair of mixers in the first and second double conversion circuitry comprises a first mixer to convert between the signal of more than the first predetermined frequency and the second predetermined frequency and a second mixer to convert between the signal of the second predetermined frequency and the third predetermined frequency,

a variable local oscillator (LO) signal is supplied to the first mixer, a frequency of the variable LO signal dependent on a frequency of the signal of more than the first predetermined frequency, and

a fixed LO signal is supplied to the second mixer.

10. The apparatus of claim 8, wherein:

each pair of BPFs has the same passband.

11. The apparatus of claim 10, wherein:

the passband is 19-21 GHz and the second predetermined frequency is about 20 GHz.

12. A method for operating a testing apparatus, the method comprising:

controlling, using a controller in the testing apparatus, a device under test (DUT) to transmit a signal;

switching reception between a receiver bypass position used when the signal has at most a first predetermined frequency and a receiver direct position when the signal has more than the first predetermined frequency;

double converting the signal of more than the first predetermined frequency by upconverting the signal to an intermediate frequency (IF) signal before downconverting the IF signal to a signal of the first predetermined frequency;

bypassing double conversion of the signal when the signal has at most the first predetermined frequency; and

supplying to an analog-to-digital converter (ADC) the signal of the first predetermined frequency or the signal of at most the first converted frequency, depending on whether the receiver bypass position or receiver direct position is being used, the signal from the ADC used to evaluate the DUT.

13. The method of claim 12, further comprising:

converting at a digital-to-analog converter (DAC) a digital signal to the signal of the first predetermined frequency or the signal of at most the first converted frequency, depending on which of a transmitter bypass position or a transmitter direct position is being used;

double converting the signal of the first predetermined frequency by upconverting the signal of the first predetermined frequency to the IF signal before downconverting the IF signal to the signal of the more than the first predetermined frequency;

bypassing double conversion of the signal from the DAC when the signal from the DAC has at most the first predetermined frequency; and

supplying the signal of more than the first predetermined frequency or the signal of at most the first converted frequency to the DUT, depending on which of the transmitter bypass position or transmitter direct position is being used.

14. The method of claim 12, further comprising:

amplifying or attenuating the signal from the DUT prior to lowpass filtering the signal from the DUT to produce a lowpass filtered signal to limit distortion of the signal;

bandpass filtering the lowpass filtered signal after upconverting the lowpass filtered signal and prior to downcoverting the IF signal;

amplifying a bandpass filtered signal prior to downcoverting the IF signal; and

lowpass filtering the signal of the first predetermined frequency to produce another lowpass filtered signal supplied to the ADC.

15. The method of claim 14, wherein:

the bandpass filtering the lowpass filtered signal after upconverting the lowpass filtered signal and prior to downcoverting the IF signal uses a bandpass filter having a same band.

16. The method of claim 14, wherein:

the lowpass filtering of the signal from the DUT has a higher cutoff frequency than the lowpass filtering of the signal of the first predetermined frequency.

17. The method of claim 12, wherein:

upconverting the signal to the IF signal comprises using a variable local oscillation (LO) signal that has a frequency dependent on the more than the first predetermined frequency to upconvert the signal of more than the first predetermined frequency to the same IF independent of the more than the first predetermined frequency, and

downconverting the IF signal to the signal of the first predetermined frequency comprises using a fixed LO signal.

18. At least one non-transitory machine-readable medium containing instructions for operating an apparatus of a testing device that configure the apparatus to:

control a device under test (DUT) to transmit a DUT signal in a testing device reception mode and, in a testing device transmission mode, to receive a testing device signal from the testing device;

switch reception between a receiver bypass mode when the DUT or testing device signal has at most a first predetermined frequency and a receiver direct mode when the DUT or testing device signal has more than the first predetermined frequency;

double convert the DUT or testing device signal of more than the first predetermined frequency by;

in the testing device reception mode, upconversion of the DUT signal to an intermediate frequency (IF) signal before downconversion of the IF signal to a signal of the first predetermined frequency; and

in the testing device transmission mode, upconversion of the signal of the first predetermined frequency to the IF signal before downconversion of the IF signal to the testing device signal; and

bypass double conversion of the DUT or testing device signal when the DUT or testing device signal has at most the first predetermined frequency.

19. The medium of claim 18, wherein the instructions further configure the apparatus to:

in the testing device reception mode;

amplify or attenuate the DUT signal prior to lowpass filtering the DUT signal;

lowpass filter the DUT signal;

lowpass filter the signal of the first predetermined frequency or the signal of at most the first converted frequency, dependent on whether the testing device is in the receiver bypass mode or receiver direct mode; and

convert the signal of the first predetermined frequency or the signal of at most the first converted frequency after lowpass filtering to a digital DUT signal;

in the testing device transmission mode;

convert a digital testing device signal to the signal of the first predetermined frequency or the signal of at most the first converted frequency;

lowpass filter the signal of the first predetermined frequency or the signal of at most the first converted frequency dependent on whether the testing device is in a transmitter bypass mode or transmitter direct mode;

lowpass filter the testing device signal; and

amplify or attenuate the testing device signal after lowpass filtering the testing device signal.

20. The medium of claim 18, wherein the instructions further configure the apparatus to:

in the testing device reception mode and testing device transmission mode, bandpass filter the IF signal prior to and after amplification of the IF signal using bandpass filters having a same center frequency and bandwidth; and

use a variable local oscillation (LO) signal that has a frequency dependent on the more than the first predetermined frequency to, in the testing device reception mode, upconvert the DUT signal to the IF signal and, in the testing device transmission mode, downconvert the IF signal to the testing device signal, such that an IF is maintained independent of the more than the first predetermined frequency, and

use a fixed LO signal to, in the testing device reception mode, downconvert the IF signal to the signal of the first predetermined frequency and, in the testing device transmission mode, upconvert the signal of the first predetermined frequency to the IF signal.