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Granular dynamic test systems and methods

  • US 10,481,203 B2
  • Filed: 04/03/2017
  • Issued: 11/19/2019
  • Est. Priority Date: 04/04/2015
  • Status: Active Grant
First Claim
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1. A system comprising:

  • a global clock input for receiving a global clock associated with circuit testing operations;

    a plurality of partitions;

    a skew tolerant interface configured to compensate for clock skew differences between a global clock from outside at least one of the plurality of partitions and a balanced local clock within at least one of the plurality of partitions, wherein the skew tolerant interface includes a first de-skew sub system for a circuit test input path of the at least one of the plurality of partitions and a second de-skew sub-system for a circuit test output path of the at least one of the plurality of partitions.

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