Systems and methods for reducing manufacturing failure rates
First Claim
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1. A system for reducing failure rates of a manufactured product comprising:
- one or more processors; and
memory storing instructions that, when executed by the one or more processors, cause the system to perform;
receiving, from a database, a first product data set associated with a first batch of a first product, the first product data set including a first product formula, a plurality of first product examples, and first test results of the plurality of first product examples, the first test results being associated with a post-manufacturing test, at least a portion of the first product data set being based on first sensor data recorded by one or more first sensors, the first sensor data being stored as time-series data of first sensor measurements;
receiving, from the database, a second product data set associated with a second batch of a second product, the second product being different from the first product, the second product data set including a second product formula, a plurality of second product examples, and second test results of the plurality of second product examples, the second test results being associated with the post-manufacturing test, at least a portion of the second product data set being based on second sensor data recorded by one or more second sensors, the second sensor data being stored as time-series data of second sensor measurements;
clustering, by machine learning, a first product cluster including the first product data set and the second product data set according to a comparison between the first product formula and the second product formula;
determining, based on the clustering, a failure rate reduction mechanism of at least one product of the first product cluster, wherein the determining the failure rate reduction mechanism comprises;
identifying, based on the clustering, the post-manufacturing test from a plurality of different post-manufacturing tests based on one or more failure results of the post-manufacturing test included in the first test results and the second test results; and
modifying, based on the clustering, a passing quality parameter range of the post-manufacturing test such that the failing result is within a modified passing quality parameter range of the post-manufacturing test.
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Abstract
Systems and methods are provided for reducing failure rates of a manufactured products. Manufactured products may be clustered together according to similarities in their production data. Manufactured product clusters may be analyzed to determine mechanisms for failure rate reduction, including adjustments to test quality parameters, product formulas, and product processes. Recommended product adjustments may be provided.
149 Citations
17 Claims
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1. A system for reducing failure rates of a manufactured product comprising:
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one or more processors; and memory storing instructions that, when executed by the one or more processors, cause the system to perform; receiving, from a database, a first product data set associated with a first batch of a first product, the first product data set including a first product formula, a plurality of first product examples, and first test results of the plurality of first product examples, the first test results being associated with a post-manufacturing test, at least a portion of the first product data set being based on first sensor data recorded by one or more first sensors, the first sensor data being stored as time-series data of first sensor measurements; receiving, from the database, a second product data set associated with a second batch of a second product, the second product being different from the first product, the second product data set including a second product formula, a plurality of second product examples, and second test results of the plurality of second product examples, the second test results being associated with the post-manufacturing test, at least a portion of the second product data set being based on second sensor data recorded by one or more second sensors, the second sensor data being stored as time-series data of second sensor measurements; clustering, by machine learning, a first product cluster including the first product data set and the second product data set according to a comparison between the first product formula and the second product formula; determining, based on the clustering, a failure rate reduction mechanism of at least one product of the first product cluster, wherein the determining the failure rate reduction mechanism comprises; identifying, based on the clustering, the post-manufacturing test from a plurality of different post-manufacturing tests based on one or more failure results of the post-manufacturing test included in the first test results and the second test results; and modifying, based on the clustering, a passing quality parameter range of the post-manufacturing test such that the failing result is within a modified passing quality parameter range of the post-manufacturing test. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A computer implemented method for reducing failure rates of a manufactured product, the method being performed on a computer system having one or more physical processors programmed with computer program instructions that, when executed by the one or more physical processors, cause the computer system to perform the method, the method comprising:
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receiving, from a database, a first product data set associated with a first batch of a first product, the first product data set including a first product formula, a plurality of first product examples, and first test results of the plurality of first product examples, the first test results being associated with a post-manufacturing test, at least a portion of the first product data set being based on first sensor data recorded by one or more first sensors, the first sensor data being stored as time-series data of first sensor measurements; receiving, from the database, a second product data set associated with a second batch of a second product, the second product being different from the first product, the second product data set including a second product formula, a plurality of second product examples, and second test results of the plurality of second product examples, the second test results being associated with the post-manufacturing test, at least a portion of the second product data set being based on second sensor data recorded by one or more second sensors, the second sensor data being stored as time-series data of second sensor measurements; clustering, by machine learning, a first product cluster including the first product data set and the second product data set according to a comparison between the first product formula and the second product formula; determining, based on the clustering, a failure rate reduction mechanism of at least one product of the first product cluster, wherein the determining the failure rate reduction mechanism comprises; identifying, based on the clustering, the post-manufacturing test from a plurality of different post-manufacturing tests based on one or more failure results of the post-manufacturing test included in the first test results and the second test results; and modifying, based on the clustering, a passing quality parameter range of the post-manufacturing test such that the failing result is within a modified passing quality parameter range of the post-manufacturing test. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16)
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17. A non-transitory computer readable medium comprising instructions that, when executed, cause one or more processors to perform:
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receiving, from a database, a first product data set associated with a first batch of a first product, the first product data set including a first product formula, a plurality of first product examples, and first test results of the plurality of first product examples, the first test results being associated with a post-manufacturing test, at least a portion of the first product data set being based on first sensor data recorded by one or more first sensors, the first sensor data being stored as time-series data of first sensor measurements; receiving, from the database, a second product data set associated with a second batch of a second product, the second product being different from the first product, the second product data set including a second product formula, a plurality of second product examples, and second test results of the plurality of second product examples, the second test results being associated with the post-manufacturing test, at least a portion of the second product data set being based on second sensor data recorded by one or more second sensors, the second sensor data being stored as time-series data of second sensor measurements; clustering, by machine learning, a first product cluster including the first product data set and the second product data set according to a comparison between the first product formula and the second product formula; determining, based on the clustering, a failure rate reduction mechanism of at least one product of the first product cluster, wherein the determining the failure rate reduction mechanism comprises; identifying, based on the clustering, the post-manufacturing test from a plurality of different post-manufacturing tests based on one or more failure results of the post-manufacturing test included in the first test results and the second test results; and modifying, based on the clustering, a passing quality parameter range of the post-manufacturing test such that the failing result is within a modified passing quality parameter range of the post-manufacturing test.
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Specification