Three-dimensional vertical one-time-programmable memory comprising multiple antifuse sub-layers
First Claim
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1. A three-dimensional vertical one-time-programmable memory (3D-OTPV), comprising:
- a semiconductor substrate comprising a substrate circuit;
a plurality of vertically stacked horizontal address lines above said semiconductor circuit, wherein said horizontal address lines comprise at least a first conductive material;
a plurality of memory holes through said horizontal address lines;
an antifuse layer on the sidewalls of said memory holes, said antifuse layer comprising at least first and second sub-layers, wherein said first and second sub-layers comprise different antifuse materials;
a plurality of vertical address lines in said memory holes and in contact with said anitfuse layer, wherein said vertical address lines comprise at least a second conductive material;
a plurality of OTP cells at the intersections of said horizontal and vertical address lines, wherein each of said OTP cells comprises at least a first portion of a first selected one of said horizontal address lines, at least a second portion of a second selected one of said vertical address lines, and at least a third portion of said antifuse layer;
wherein said horizontal and vertical address lines are separated by said antifuse layer only.
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Abstract
The present invention discloses a three-dimensional vertical one-time-programmable memory (3D-OTPV). It comprises horizontal address lines and memory holes there-through, an antifuse layer and vertical address lines in said memory holes. The antifuse layer comprises at least first and second sub-layers with different antifuse materials. The 3D-OTPV comprises no separate diode layer.
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11 Claims
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1. A three-dimensional vertical one-time-programmable memory (3D-OTPV), comprising:
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a semiconductor substrate comprising a substrate circuit; a plurality of vertically stacked horizontal address lines above said semiconductor circuit, wherein said horizontal address lines comprise at least a first conductive material; a plurality of memory holes through said horizontal address lines; an antifuse layer on the sidewalls of said memory holes, said antifuse layer comprising at least first and second sub-layers, wherein said first and second sub-layers comprise different antifuse materials; a plurality of vertical address lines in said memory holes and in contact with said anitfuse layer, wherein said vertical address lines comprise at least a second conductive material; a plurality of OTP cells at the intersections of said horizontal and vertical address lines, wherein each of said OTP cells comprises at least a first portion of a first selected one of said horizontal address lines, at least a second portion of a second selected one of said vertical address lines, and at least a third portion of said antifuse layer; wherein said horizontal and vertical address lines are separated by said antifuse layer only. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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Specification