Selective atomic layer etching of semiconductor materials
First Claim
1. An etching method comprising:
- flowing a halogen-containing precursor into a processing region of a semiconductor processing chamber;
contacting an exposed region of a semiconductor material with the halogen-containing precursor such that the halogen-containing precursor is adsorbed on a surface of the exposed region of the semiconductor material;
forming a film of the halogen-containing precursor of a predetermined thickness on the surface of the exposed region of the semiconductor material;
pausing the flow of the halogen-containing precursor into the processing region of the semiconductor processing chamber; and
etching the exposed region of the semiconductor material with the adsorbed halogen-containing precursor, wherein the adsorbed halogen-containing precursor produces a fluoride of the semiconductor material.
1 Assignment
0 Petitions
Accused Products
Abstract
Precursors, such as interhalogens and/or compounds formed of noble gases and halogens, may be supplied in a gaseous form to a semiconductor processing chamber at a predetermined amount, flow rate, pressure, and/or temperature in a cyclic manner such that atomic layer etching of select semiconductor materials may be achieved in each cycle. In the etching process, the element of the precursor that has a relatively higher electronegativity may react with select semiconductor materials to form volatile etching byproducts. The element of the precursor that has a relatively lower electronegativity may form a gas that may be recycled to re-form an precursor with one or more halogen-containing materials using a plasma process.
2013 Citations
20 Claims
-
1. An etching method comprising:
-
flowing a halogen-containing precursor into a processing region of a semiconductor processing chamber; contacting an exposed region of a semiconductor material with the halogen-containing precursor such that the halogen-containing precursor is adsorbed on a surface of the exposed region of the semiconductor material; forming a film of the halogen-containing precursor of a predetermined thickness on the surface of the exposed region of the semiconductor material; pausing the flow of the halogen-containing precursor into the processing region of the semiconductor processing chamber; and etching the exposed region of the semiconductor material with the adsorbed halogen-containing precursor, wherein the adsorbed halogen-containing precursor produces a fluoride of the semiconductor material. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
-
-
12. An etching method comprising:
-
flowing a halogen-containing precursor into a processing region of a semiconductor processing chamber; contacting an exposed region of a metal-containing material with the halogen-containing precursor such that the halogen-containing precursor is adsorbed on a surface of the exposed region of the metal-containing material; forming a film of the halogen-containing precursor on the surface of the exposed region of the metal-containing material; pausing the flow of the halogen-containing precursor into the processing region of the semiconductor processing chamber; and etching the exposed region of the metal-containing material with the adsorbed halogen-containing precursor, wherein the adsorbed halogen-containing precursor produces a fluoride of the metal-containing material. - View Dependent Claims (13, 14, 15, 16, 17)
-
-
18. An etching method comprising:
-
flowing a first halogen-containing precursor into a processing region of a semiconductor processing chamber, wherein the first halogen-containing precursor comprises a noble gas compound precursor; contacting an exposed region of a semiconductor material with the first halogen-containing precursor such that the first halogen-containing precursor is adsorbed on a surface of the exposed region of the semiconductor material; etching the exposed region of the semiconductor material with the adsorbed first halogen-containing precursor, wherein the adsorbed first halogen-containing precursor produces a gaseous byproduct; and forming a second halogen-containing precursor from the gaseous byproduct using plasma. - View Dependent Claims (19, 20)
-
Specification