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Method for fabricating semiconductor device

  • US 10,497,810 B2
  • Filed: 01/21/2019
  • Issued: 12/03/2019
  • Est. Priority Date: 04/07/2015
  • Status: Active Grant
First Claim
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1. A method for fabricating semiconductor device, comprising:

  • providing a substrate having a first region and a second region;

    forming a first fin-shaped structure on the first region and a second fin-shaped structure on the second region;

    forming a first spacer adjacent to the first fin-shaped structure and a second spacer adjacent to the second fin-shaped structure;

    using the first spacer and the second spacer as mask to remove part of the substrate for forming a third fin-shaped structure on the first region and a fourth fin-shaped structure on the second region, wherein the third fin-shaped structure comprises a first top portion and a first bottom portion and the fourth fin-shaped structure comprises a second top portion and a second bottom portion;

    forming a first doped layer on the first fin-shaped structure and the second fin-shaped structure;

    forming a first hard mask on the first doped layer;

    removing the first hard mask and the first doped layer on the second region; and

    forming a second doped layer on the first region and the second region.

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