Criticality analysis augmented process window qualification sampling
First Claim
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1. A method comprising:
- sorting, using a processor, defects from a plurality of design based grouping bins into a plurality of categories based on a plurality of process conditions;
sorting, using the processor, the defects based on similarity of design into a plurality of bins, wherein each of the bins includes at least one of the design based grouping bins;
selecting, using the processor, a random defect from the defects in each of the design based grouping bins;
performing, using the processor, shape based grouping on each of the random defects;
for each of the bins, selecting, using the processor, one of the design based grouping bins with a score on an end of a range of scores after the shape based grouping, wherein the score is a highest score or a lowest score;
assigning, using the processor, the respective score that was selected to each of the bins;
sorting, using the processor, the bins in order by the respective scores; and
selecting, using the processor, one of the defects with a highest defect attribute value from each of the bins for each of the plurality of process conditions.
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Abstract
Techniques are provided that can select defects based on criticality of design pattern as well as defect attributes for process window qualification (PWQ). Defects are sorted into categories based on process conditions and similarity of design. Shape based grouping can be performed on the random defects. Highest design based grouping scores can be assigned to the bins, which are then sorted. Particular defects can be selected from the bins. These defects may be reviewed.
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Citations
18 Claims
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1. A method comprising:
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sorting, using a processor, defects from a plurality of design based grouping bins into a plurality of categories based on a plurality of process conditions; sorting, using the processor, the defects based on similarity of design into a plurality of bins, wherein each of the bins includes at least one of the design based grouping bins; selecting, using the processor, a random defect from the defects in each of the design based grouping bins; performing, using the processor, shape based grouping on each of the random defects; for each of the bins, selecting, using the processor, one of the design based grouping bins with a score on an end of a range of scores after the shape based grouping, wherein the score is a highest score or a lowest score; assigning, using the processor, the respective score that was selected to each of the bins; sorting, using the processor, the bins in order by the respective scores; and selecting, using the processor, one of the defects with a highest defect attribute value from each of the bins for each of the plurality of process conditions. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A system comprising:
a processor in electronic communication with an electronic data storage unit and a wafer inspection tool, wherein the processor is configured to; sort defects from a plurality of design based grouping bins into a plurality of categories based on a plurality of process conditions; sort the defects based on similarity of design into a plurality of bins, wherein each of the bins includes at least one of the design based grouping bins; select a random defect from the defects in each of the design based grouping bins; perform shape based grouping on each of the random defects; for each of the bins, select one of the design based grouping bins with a score on an end of a range of scores after the shape based grouping, wherein the score is a highest score or a lowest score; assign the respective score that was selected to each of the bins; sort the bins in order by the respective scores; and select one of the defects with a highest defect attribute value from each of the bins for each of the plurality of process conditions. - View Dependent Claims (10, 11, 12)
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13. A non-transitory computer-readable storage medium, comprising one or more programs for executing the following steps on one or more computing devices:
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sorting defects from a plurality of design based grouping bins into a plurality of categories based on a plurality of process conditions; sorting the defects based on similarity of design into a plurality of bins using a bin merge algorithm, wherein each of the bins includes at least one of the design based grouping bins; selecting a random defect from the defects in each of the design based grouping bins; performing shape based grouping on each of the random defects; for each of the bins, selecting one of the design based grouping bins with a score on an end of a range of scores after the shape based grouping, wherein the score is a highest score or a lowest score; assigning the respective score that was selected to each of the bins; sorting the bins in order by the respective scores; and selecting one of the defects with a highest defect attribute value from each of the bins for each of the plurality of process conditions. - View Dependent Claims (14, 15, 16, 17, 18)
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Specification