Measurement substrate and a measurement method
First Claim
1. A measurement substrate for measuring a condition pertaining in an apparatus for processing production substrates during operation thereof, the measurement substrate comprising:
- a body having dimensions similar to that of a production substrate so that the measurement substrate is compatible with the apparatus;
a plurality of sensor modules in the body, the plurality of sensor modules arranged in a two-dimensional array, each sensor module comprising;
a sensor configured to generate an analog measurement signal, the sensor comprising at least a temperature sensor or a strain sensor,an analog to digital converter configured to generate digital measurement information from the analog measurement signal, anda module controller configured to output the digital measurement information; and
a central control module configured to receive the digital measurement information from each of the module controllers and to communicate the digital measurement information to an external device.
1 Assignment
0 Petitions
Accused Products
Abstract
A measurement substrate for measuring a condition pertaining in an apparatus for processing production substrates during operation thereof, the measurement substrate including: a body having dimensions compatible with the apparatus; a plurality of sensor modules embedded in the body, each sensor module having: a sensor configured generate an analog measurement signal, an analog to digital converter to generate digital measurement information from the analog measurement signal, and a module controller configured to output the digital measurement information; and a central control module configured to receive the digital measurement information from each of the module controllers and to communicate the digital measurement information to an external device.
13 Citations
21 Claims
-
1. A measurement substrate for measuring a condition pertaining in an apparatus for processing production substrates during operation thereof, the measurement substrate comprising:
-
a body having dimensions similar to that of a production substrate so that the measurement substrate is compatible with the apparatus; a plurality of sensor modules in the body, the plurality of sensor modules arranged in a two-dimensional array, each sensor module comprising; a sensor configured to generate an analog measurement signal, the sensor comprising at least a temperature sensor or a strain sensor, an analog to digital converter configured to generate digital measurement information from the analog measurement signal, and a module controller configured to output the digital measurement information; and a central control module configured to receive the digital measurement information from each of the module controllers and to communicate the digital measurement information to an external device. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
-
-
12. A method of measuring conditions in an apparatus for processing production substrates, the method comprising:
-
loading into the apparatus a measurement substrate having dimensions similar to that of a production substrate so that the measurement substrate is compatible with the apparatus, the measurement substrate having a central control module and plurality of sensor modules, the plurality of sensor modules arranged in a two-dimensional array, each sensor module comprising a sensor and an analog to digital converter, the sensor comprising at least a temperature sensor or a strain sensor; operating at least one of the sensors to generate an analog measurement signal; using at least one of the analog to digital converters to convert the analog measurement signal to digital measurement information; transferring the digital measurement information to the central control module; and outputting the digital measurement information from the central control module to an external device. - View Dependent Claims (13, 14, 15, 16, 17, 18)
-
-
19. A measurement substrate for measuring a condition pertaining in an apparatus for processing production substrates during operation thereof, the measurement substrate comprising:
-
a body having dimensions similar to that of a production substrate so that the measurement substrate is compatible with the apparatus; a plurality of sensor modules in the body, the plurality of sensor modules arranged in a two-dimensional array, each sensor module comprising; a sensor configured to generate an analog measurement signal, the sensor comprising at least a temperature sensor or a strain sensor, an analog to digital converter configured to generate digital measurement information from the analog measurement signal, and a module controller configured to output the digital measurement information; a central control module configured to receive the digital measurement information from each of the module controllers and to communicate the digital measurement information to an external device; and a switch configured to cause one or more sensor modules to be de-active while allowing one or more other sensor modules of the sensor modules to be active. - View Dependent Claims (20)
-
-
21. A measurement substrate for measuring a condition pertaining in an apparatus for processing production substrates during operation thereof, the measurement substrate comprising:
-
a body having dimensions similar to that of a production substrate so that the measurement substrate is compatible with the apparatus; a plurality of sensor modules in the body formed by a standard CMOS process, each sensor module comprising; a sensor configured to generate an analog measurement signal, the sensor comprising at least a temperature sensor or a strain sensor, wherein the sensor is embedded in the body, an analog to digital converter configured to generate digital measurement information from the analog measurement signal, and a module controller configured to output the digital measurement information; and a central control module configured to receive the digital measurement information from each of the module controllers and to communicate the digital measurement information to an external device.
-
Specification