Low distortion successive approximation register (SAR) analog-to-digital converters (ADCs) and associated methods

• US 10,511,320 B2
• Filed: 09/24/2018
• Issued: 12/17/2019
• Est. Priority Date: 09/28/2017
• Status: Active Grant

• Current Assignee: Taiwan Semiconductor Manufacturing Company Limited
• Original Assignee: Taiwan Semiconductor Manufacturing Company Limited
• Inventors: Chuang, Mei-Chen
• Primary Examiner(s): Lauture, Joseph J
• Application Number:
  US16/139,146
• Publication Number:
  US 20190097646A1
• Time in Patent Office: 449 Days
• Field of Search: 341172, 341155, 341120, 341122
• CPC Class Codes: G11C 27/02 Sample-and-hold arrangements G11C27/04 takes precedence
• CPC Class Codes: H03M 1/06 Continuously compensating for, or preventing, undesired influence of physical parameters periodically, e.g. by using stored correction values, H03M1/10
• CPC Class Codes: H03M 1/0614 of harmonic distortion H03M1/0617 takes precedence
• CPC Class Codes: H03M 1/10 Calibration or testing
• CPC Class Codes: H03M 1/12 Analogue/digital converters H03M1/001 – H03M1/10 take precedence
• CPC Class Codes: H03M 1/462 Details of the control circuitry, e.g. of the successive approximation register
• CPC Class Codes: H03M 1/466 using switched capacitors
• CPC Class Codes: H03M 1/468 in which the input S/H circuit is merged with the feedback DAC array
• CPC Class Codes: H03M 1/68 with conversions of different sensitivity, i.e. one conversion relating to the more significant digital bits and another conversion to the less significant bits
• CPC Class Codes: H03M 1/802 using capacitors, e.g. neuron-mos transistors, charge coupled devices
• CPC Class Codes: H03M 1/804 with charge redistribution

Abstract

An ADC device comprises a comparator having an output, a first input, and a second input. And the ADC includes a SAR configured to receive the output of the comparator as an input and to generate based thereon a parallel digital output having a most significant bit (MSB) and a plurality of less significant bits associated with a reference voltage. The ADC also includes a DAC configured to receive the parallel digital output from the SAR and to generate based thereon an internal analog signal, the internal analog signal applied as the first input to the comparator. The DAC further includes a capacitor network coupled to the first input having a redistribution capacitor coupled to a first voltage that is greater than the reference voltage such that a ratio N is equal to the reference voltage divided by the first voltage. The DAC also includes one or more first capacitors also coupled to the first voltage, where at least one first capacitor is associated with the MSB. The DAC further including and a plurality of second capacitors coupled to the reference voltage, wherein the redistribution capacitor having a capacitive value that is equal to (1−N) times the total capacitance of a parallel combination of the one or more first capacitors. And the second capacitors are associated with less significant bits, and an input voltage line carrying an input voltage (V_IN) switchably coupled to the first input or switchably coupled to the second input.

Claims

1. An analog-to-digital converter (ADC) device comprising:

a comparator having an output, a first input, and a second input;

a successive approximation register (SAR) configured to receive the output of the comparator as an input and to generate based thereon a parallel digital output having a most significant bit (MSB) and a plurality of less significant bits associated with a reference voltage;

a digital-to-analog converter (DAC) configured to receive the parallel digital output from the SAR and to generate based thereon an internal analog signal, the internal analog signal applied as the first input to the comparator,

wherein the DAC includes a capacitor network coupled to the first input having;

a redistribution capacitor coupled to a first voltage that is greater than the reference voltage such that a ratio N is equal to the reference voltage divided by the first voltage;

one or more first capacitors also coupled to the first voltage at least one first capacitor associated with the MSB; and

a plurality of second capacitors coupled to the reference voltage, wherein the redistribution capacitor having a capacitive value that is equal to (1−

N) times the total capacitance of a parallel combination of the one or more first capacitors, further wherein the second capacitors are associated with less significant bits; and

an input voltage line carrying an input voltage (V_IN) switchably coupled to the first input or switchably coupled to the second input.

2. The ADC of claim 1, wherein:

the SAR is configured to perform a binary search to test each possible bit of the parallel digital output,

wherein beginning with the MSB each bit is tested by comparing, by the comparator, the internal analog signal to the VIN signal, and

based upon the comparator sensing that the internal analog signal exceeds the Vrn signal, the comparator asserts a signal causing the SAR to either de-assert the tested bit or to set the tested bit.

3. The ADC of claim 1, wherein based upon the MSB remaining high during testing, one or more of the first capacitors associated with one or more more-significant bits is tied to V_DD, wherein the MSB is one of the one or more significant bits.

4. The ADC of claim 1, wherein Vrn is sampled from a varying analog signal by a sample and hold circuit.

5. The ADC of claim 1, wherein the SAR implements a successive approximation algorithm.

6. The ADC of claim 1, wherein the one or more first capacitors is associated with one or more significant bits in addition to the MSB.

7. The ADC of claim 1, wherein at the SAR performs a binary search of values of the parallel digital output.

8. The ADC of claim 1, further comprising a plurality of switches respectively configured to decouple the first capacitor from VDD and to decouple the plurality of second capacitors from V_REF.

9. A method for performing an analog-to-digital conversion, the method comprising:

supplying an input voltage (V_IN) as a second input to a comparator having an output, a first input, and the second input;

supplying the output of the comparator to an input of a successive approximation register (SAR) to generate based thereon a parallel digital output having a plurality of more significant bits, including a most significant bit (MSB), and a plurality of less significant bits;

supplying the parallel digital output to a digital-to-analog converter (DAC) to generate based thereon an internal analog signal, the internal analog signal applied as the first input to the comparator, wherein the internal analog signal is generated by voltage division across a plurality of capacitors,

wherein the DAC includes a first capacitor network having a first capacitor and a second capacitor network having plurality of second capacitors, and a third capacitor network having a plurality of third capacitors, the first capacitor having a value based on the total parallel capacitance of each of the second capacitors and coupled between a first line carrying a first voltage and a second line carrying a second voltage, the plurality of second capacitors associated with the plurality of more significant bits, including the MSB, further wherein the plurality of second capacitors each switchable coupled between the first line and the second line and having respectively a value based on a ratio of the first voltage to a third voltage that is less than the first voltage, further wherein the plurality of third capacitors are associated with the less significant bits and respectively switchably coupled between the first line and a third line carrying the third voltage.

10. The method of claim 9, wherein:

the SAR performs a binary search to test each possible bit of the parallel digital output,

wherein beginning with the MSB each bit is tested by comparing, by the comparator, the internal analog signal to the V_IN signal; and

based upon the comparator sensing that the internal analog signal exceeds the V_IN signal, the comparator asserts a signal causing the SAR to either de-assert the tested bit or set the tested bit.

11. The method of claim 9, wherein when none of the more significant bits remains high during testing, the redistribution capacitor is switchably decoupled from the first line.

12. The method of claim 9, wherein the first voltage is V_DD.

13. The method of claim 12, wherein the first voltage is V_SS.

14. The method of claim 13, wherein the third voltage is a reference voltage V_REF.

15. The method of claim 9, wherein based upon the MSB being set high and the less significant bits being set low, the internal analog signal is equal to V_REF/2.

16. The method of claim 9, further comprising providing a plurality of switches respectively configured to switchably couple the first capacitor to the first line and to switchably couple the plurality of third capacitors from the third voltage line.

17. A digital-to-analog converter (DAC), comprising:

a capacitor network having a first capacitor and a plurality of second capacitors,

the first capacitor being coupled to a first line carrying a first voltage and a second line carrying a second voltage, and

the plurality of second capacitors being coupled to the second line and to a first node switchably coupled by a first switch to a third line carrying a third voltage, and

wherein the third voltage is a reference voltage, and the first capacitor is not connected or switchably adapted to connect to the third line, and

wherein the first voltage is greater than the third voltage and a successive approximation register (SAR) output controls the first switch.

18. The DAC of claim 17, wherein the first voltage is a supply voltage V_DD.

19. The DAC of claim 17, further comprising a plurality of switches respectively configured to switchably couple the first capacitor to the first voltage when one or more capacitors associated with more significant bits are also switchably coupled to the first voltage, wherein the plurality of switches are controlled by signals from the SAR.

20. The DAC of claim 17, wherein the SAR performs a successive approximation algorithm.