Hamming-distance analyzer
First Claim
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1. A device, comprising:
- a memory array configured to store a first response in a plurality of responses of an under-test device;
a comparing circuit configured to compare the first response with the plurality of responses of the under-test device operated in operating conditions corresponding to different operating environments, to generate comparing results,wherein the comparing circuit is configured to perform an exclusive OR operation of the first response and each one of the plurality of responses to generate the comparing results, and further configured to generate a final comparing result according to the comparing results,wherein an Xth bit of a first comparing result of the comparing results, which is generated prior to a second comparing result of the comparing results, has a first logic value, and an Xth bit of the second comparing result is configured to have the first logic value; and
a calculating circuit configured to generate a value indicating a number of bits having the first logic value, of the final comparing result, and to generate, according to the value and a bit number of the final comparing result, a maximum hamming distance representing a robustness of the under-test device between two of the plurality of responses, wherein the bit number is a number of bits of the final comparing result.
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Abstract
A device is disclosed that includes a memory array, a comparing circuit, and a calculating circuit. The memory array is configured to store a first response of an under-test device. The comparing circuit is configured to compare the first response with a plurality of responses of the under-test device operated in conditions that are different from each other to generate comparing results. The calculating circuit is configured to output a maximum hamming distance between two of the first response and the plurality of responses according to the comparing results.
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Citations
20 Claims
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1. A device, comprising:
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a memory array configured to store a first response in a plurality of responses of an under-test device; a comparing circuit configured to compare the first response with the plurality of responses of the under-test device operated in operating conditions corresponding to different operating environments, to generate comparing results, wherein the comparing circuit is configured to perform an exclusive OR operation of the first response and each one of the plurality of responses to generate the comparing results, and further configured to generate a final comparing result according to the comparing results, wherein an Xth bit of a first comparing result of the comparing results, which is generated prior to a second comparing result of the comparing results, has a first logic value, and an Xth bit of the second comparing result is configured to have the first logic value; and a calculating circuit configured to generate a value indicating a number of bits having the first logic value, of the final comparing result, and to generate, according to the value and a bit number of the final comparing result, a maximum hamming distance representing a robustness of the under-test device between two of the plurality of responses, wherein the bit number is a number of bits of the final comparing result. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method, comprising:
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retaining a first response of a plurality of responses of an under-test device in a first operating condition; varying at least one of operating conditions, corresponding to different operating environments, of the under-test device, to generate the plurality of responses of the under-test device; sequentially comparing, by a comparing circuit, the first response with the plurality of responses of the under-test device in the operating conditions, to generate comparing results, wherein each comparing result of the comparing results is generated by adjusting a previous comparing result of the comparing results; generating, by the comparing circuit, a final comparing result according to the comparing results; and generating, by a calculating circuit, a value indicating a number of bits having a first logic value, of the final comparing result, and generating, according to the value and a bit number of the final comparing result, a maximum difference representing a robustness of the under-test device between two of the plurality of responses, wherein the bit number of the final comparing result is a number of bits of the final comparing result, wherein comparing the first response with the plurality of responses comprises; performing an exclusive OR operation of the first response and a second response in the plurality of responses, to generate a first comparing result of the comparing results, wherein an Xth bit of a comparing result, which is generated prior to the first comparing result, of the comparing results, has the first logic value, and an Xth bit of the first comparing result is configured to have the first logic value. - View Dependent Claims (9, 10, 11, 12, 13, 14, 15, 16)
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17. A method, comprising:
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operating an under-test device in operating conditions corresponding to different operating environments, to obtain a plurality of responses of the under-test device; performing, by a comparing circuit, an exclusive OR operation of a first response of the plurality of responses and the plurality of responses sequentially, to generate comparing results; generating, by the comparing circuit, a final comparing result according to the comparing results; and generating, by a calculating circuit, a value indicating a number of bits, in the final comparing result, having a first logic value, and generating, according to the value and a bit number of the final comparing result, a maximum hamming distance representing a robustness of the under-test device between two of the responses, wherein the bit number of the final comparing result is a number of bits of the final comparing result, wherein an Xth bit of a first comparing result, which is generated prior to a second comparing result, of the comparing results, has the first logic value, and an Xth bit of the second comparing result is configured to have the first logic value. - View Dependent Claims (18, 19, 20)
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Specification