Position based jitter removal

• US 10,521,051 B2
• Filed: 03/31/2016
• Issued: 12/31/2019
• Est. Priority Date: 01/14/2016
• Status: Active Grant

• Current Assignee: Synaptics Incorporated
• Original Assignee: Synaptics Incorporated
• Inventors: Wang, Ying, Peng, Earl, Tan, Jingwei
• Primary Examiner(s): Pham, Viet D
• Application Number:
  US15/562,865
• Publication Number:
  US 20180307373A1
• Time in Patent Office: 1,370 Days
• CPC Class Codes: G06F 3/04182 Filtering of noise external to the device and not generated by digitiser components
• CPC Class Codes: G06F 3/0446 using a grid-like structure of electrodes in at least two directions, e.g. using row and column electrodes

Abstract

An input device (100) is configured to detect force being applied to an input region (120) of the device (100) by an input object (140), in addition to the position of the input object (140) using touch sensing methods. The input device (100) applies a position-based jitter force filter to the force sensor data to compensate for a non-uniform response across the input device (100), as well as the movement of an input object (140).

Claims

1. A method of operating a sensing device having a plurality of sensor electrodes, the method comprising:

acquiring position sensor data and force sensor data using at least one of the plurality of sensor electrodes, wherein the position sensor data indicates a position of an input object in contact with the sensing device;

determining a position of the input object based at least in part on the position sensor data;

applying a jitter force filter to modify the force sensor data, wherein a weighting of the jitter force filter is based at least in part on the position of the input object; and

determining a force of the input object based on the modified force sensor data.

2. The method of claim 1, further comprising:

determining the weighting for the jitter force filter based at least in part on one or more locations within an input region of the sensing device from which the force sensor data is acquired.

3. The method of claim 1, further comprising:

determining the weighting for the jitter force filter based at least in part on a contact location of the input object with respect to an input region of the sensing device.

4. The method of claim 3, wherein a first contact location is proximate to an edge of the input region and a second contact location is proximate to a center of the input region and the weighting for the jitter force filter varies between the first and second contact locations.

5. The method of claim 1, further comprising:

determining the weighting for the jitter force filter based on a rate of change in the force sensor data.

6. The method of claim 1, further comprising:

determining the weighting for the jitter force filter based on a movement of the input object.

7. The method of claim 6, wherein the movement of the input object comprises at least one selected from the group consisting of velocity, speed, and direction.

8. The method of claim 1, wherein the position sensor data is provided by capacitive sensor electrodes, the force sensor data is provided by force sensor electrodes, and the position sensor data is separate from the force sensor data.

9. The method of claim 1, further comprising:

determining a movement of the input object in contact with the sensing device based at least in part on the position sensor data,

wherein the weighting of the jitter force filter is based at least in part on the movement of the input object.

10. An input device comprising:

a plurality of sensor electrodes;

a processing system coupled to the plurality of sensor electrodes, wherein the processing system is configured to;

acquire capacitive sensor data and force sensor data using at least one of the plurality of sensor electrodes, wherein the capacitive sensor data indicates a position of an input object in contact with the input device;

determining a position of the input object based at least in part on the capacitive sensor data;

apply a jitter force filter to modify at least a portion of the force sensor data, wherein a weighting of the jitter force filter is based at least in part on the position of the input object; and

determine a force of the input object based on the modified force sensor data.

11. The input device of claim 10, wherein the processing system is further configured to determine a weighting for the jitter force filter that varies based on a contact location within an input region of the input device.

12. The input device of claim 10, wherein the processing system is further configured to determine the weighting for the jitter force filter based at least in part on a contact location of the input object with respect to an input region of the input device.

13. The input device of claim 12, wherein a first contact location is proximate to an edge of the input region and a second contact location is proximate to a center of the input region and the processing system is further configured to determine a weighting for the jitter force filter that varies between the first and second contact locations.

14. The input device of claim 10, wherein an input region of the input device comprises a plurality of regions, and wherein the processing system is further configured to determine a weighting for the jitter force filter based at least in part on a first region of the plurality of regions.

15. The input device of claim 10, wherein the plurality of sensor electrodes includes a first sensor electrode configured for force sensing, and

wherein the processing system is further configured to determine a weighting for the jitter force filter that varies based on proximity of a contact location to the first sensor electrode.

16. The input device of claim 10, wherein the processing system is further configured to determine a weighting for the jitter force filter based on a movement of the input object.

17. A processing system for a sensing device, the processing system comprising:

sensor circuitry coupled to a plurality of sensor electrodes, the sensor circuitry configured to acquire position sensor data and force sensor data using at least one of the plurality of sensor electrodes, wherein the position sensor data indicates a position of an input object in contact with the sensing device,

wherein the processing system is configured to;

determine a position of the input object based at least in part on the position sensor data;

apply a jitter force filter to modify at least a portion of the force sensor data, wherein a weighting of the jitter force filter is at least partially based on the position of the input object; and

determine a force of the input object based on the modified force sensor data.

18. The processing system of claim 17, wherein the processing system is further configured to determine a weighting for the jitter force filter that varies based on a contact location within an input region of the sensing device.

19. The processing system of claim 17, wherein an input region of the sensing device comprises a plurality of regions, and wherein the processing system is further configured to determine a weighting for the jitter force filter based at least in part on a first region of the plurality of regions.

20. The processing system of claim 17, wherein the processing system is further configured to determine a weighting for the jitter force filter based on a movement of the input object.