Reference circuit for metrology system

• US 10,527,503 B2
• Filed: 09/22/2016
• Issued: 01/07/2020
• Est. Priority Date: 01/08/2016
• Status: Active Grant

• Current Assignee: Apple Inc.
• Original Assignee: Apple Inc.
• Inventors: Fritchman, Daniel J., Savoj, Jafar
• Primary Examiner(s): Huls, Natalie
• Application Number:
  US15/272,941
• Publication Number:
  US 20170199089A1
• Time in Patent Office: 1,202 Days
• CPC Class Codes: G01K 15/005 Calibration
• CPC Class Codes: G01K 17/00 Measuring quantity of heat measuring temperature by calorimetry G01K3/00 - G01K11/00; specially adapted for measuring thermal properties of materials, e.g. specific heat, heat of combustion G01N
• CPC Class Codes: G01K 7/203 in an oscillator circuit
• CPC Class Codes: G01R 19/0084 measuring voltage only all subgroups of G01R19/00 take precedence
• CPC Class Codes: G01R 31/2644 Adaptations of individual semiconductor devices to facilitate the testing thereof

Abstract

Reference center circuitry for a metrology system is disclosed. In one embodiment, the circuitry includes a reference sensor having a topology and characteristics identical to a number of sensors throughout an IC. The both the reference sensor and the sensors on the IC may be used to perform voltage and temperature measurements. The reference sensor may receive a voltage from a precision voltage supply, and may be used as a sensor to provide a basis for calibrating the other sensors, as well. Thereafter, temperature readings obtained from the other sensors may be correlated to the readings obtained by the reference sensor for enhanced accuracy. The reference center circuitry also includes analog process monitoring circuitry, which may be coupled to some, if not all of the transistors implemented on an IC.

Claims

1. An integrated circuit comprising:

a plurality of sensors implemented in corresponding ones of one or more functional circuit blocks;

a metrology control circuit including;

a reference sensor, wherein the reference sensor is implemented using a circuit topology identical to each of the plurality of sensors and has substantially same operating characteristics as each of the plurality of sensors;

a precision voltage generation circuit configured to provide a known voltage value to the reference sensor, wherein the precision voltage generation circuit is separate and distinct from respective voltage sources coupled to each of the plurality of sensors;

a precision temperature sensing circuit in close proximity to the reference sensor; and

a processing circuit configured to correlate readings received from the reference sensor to a voltage received from the precision voltage generation circuit and the precision temperature sensing circuit, and further configured to calibrate each of the plurality of sensors based on the correlated readings.

2. The integrated circuit as recited in claim 1, wherein the reference sensor and each of the plurality of sensors include one or more ring oscillators, and wherein the processing circuit is configured to correlate frequency information received from each of the one or more ring oscillators of the reference sensor to the voltage received from the precision voltage generation circuit and the precision temperature sensing circuit.

3. The integrated circuit as recited in claim 2, wherein the processing circuit is configured to develop, for each of the plurality of sensors, a mathematical model of operation based on correlations of frequency information received from the ring oscillators of the reference sensor to the voltage received from the precision voltage generation circuit and the precision temperature sensing circuit.

4. The integrated circuit as recited in claim 1, wherein each of the plurality of sensors implemented in corresponding ones of one or more functional circuit blocks is coupled to receive a local supply voltage that is provided to functional circuitry implemented in its corresponding one of the functional circuit blocks.

5. The integrated circuit as recited in claim 1, wherein the precision voltage generation circuit includes a digital-to-analog converter (DAC) coupled to receive a digital value representative of a desired analog voltage.

6. The integrated circuit as recited in claim 5, wherein the precision voltage generation circuit further includes a low dropout voltage regulator coupled to receive an analog voltage from the DAC, and is coupled to provide the known voltage to the reference sensor.

7. The integrated circuit as recited in claim 5, wherein the DAC is coupled to receive the digital value from a multiplexer, wherein the multiplexer is coupled to receive a first digital value from a bandgap circuit implemented in the metrology control circuit, and a second digital value from a source external to the integrated circuit.

8. The integrated circuit as recited in claim 1, wherein the metrology control circuit further comprises an analog process monitoring circuit configured to determine operating characteristics of each transistor of at least a subset of a plurality of transistors implemented on the integrated circuit, wherein analog process monitoring circuit is coupled to receive an input voltage from the precision voltage generation circuit.

9. The integrated circuit as recited in claim 8, wherein the analog process monitoring circuit includes a digital-to-analog converter (DAC) configured to provide a voltage to a gate terminal of a selected transistor.

10. The integrated circuit as recited in claim 9, wherein the analog process monitoring circuit includes a variable resistor configured to adjust a first voltage present on terminal of the selected transistor, wherein the variable resistor is coupled to a sigma-delta analog-to-digital converter (Σ

Δ

ADC) such that a second voltage generated across the variable resistor is input into the Σ

Δ

ADC.

11. The integrated circuit as recited in claim 8, further comprising a multiplexer having a first input coupled to receive a first analog voltage from the analog process monitoring circuit, a second input coupled to receive a second analog voltage from a temperature front end circuit, and one or more additional inputs coupled to receive respective analog signals from one or more corresponding sources external to the metrology control circuit.

12. The integrated circuit as recited in claim 11, further comprising a precision analog-to-digital converter (ADC) circuit coupled to receive a selected analog signal from the multiplexer.

13. A method comprising:

generating a known voltage using a precision voltage generation circuit, wherein the precision voltage generation circuit is separate and distinct from respective voltage sources coupled to each of a plurality of sensors implemented on an integrated circuit that are each implemented using a circuit topology identical to a reference sensor, and have a same set of operating characteristics as the reference sensor;

providing the known voltage to the reference sensor implemented on the integrated circuit, wherein the reference sensor includes one or more ring oscillators;

determining a temperature using a precision temperature sensing circuit implemented on the integrated circuit in close proximity to the reference sensor;

correlating, using a processing circuit, frequencies obtained from each of the one or more ring oscillators of the reference sensor with the voltage provided to the reference sensor and the temperature determined by precision temperature sensing circuit; and

calibrating the plurality of sensors, wherein calibrating the plurality of sensors is based on readings obtained from correlating frequencies obtained from the reference sensor with the voltage provided to the reference sensor and the temperature determined by precision temperature sensing circuit.

14. The method as recited in claim 13, further comprising the processing circuit developing, for each of the plurality of sensors, a mathematical model of operation based on correlating frequencies obtained from the reference sensor to the voltage provided to the reference sensor and the temperature determined by the precision temperature sensing circuit, wherein calibrating each of the plurality of sensors comprises characterizing ring oscillators of each of the plurality of sensors by a polynomial.

15. The method as recited in claim 13, wherein the precision voltage generation circuit includes a digital-to-analog converter (DAC), and wherein the method further comprises:

providing a digital value to the DAC, the digital value being indicative of a desired value of the known voltage; and

converting the digital value into the known voltage.

16. A system comprising:

a plurality of sensors implemented in corresponding ones of one or more functional circuit blocks of the system, each of the plurality of sensors having an identical circuit topology and including one or more ring oscillators;

a metrology control circuit including;

a reference sensor implemented using the circuit topology of each of the plurality of sensors, wherein operating characteristics of the reference sensor and each of the plurality of sensors are substantially alike;

a reference temperature sensor implemented in close proximity to the reference sensor;

a reference voltage generator coupled to provide a reference voltage to the reference sensor, wherein the reference voltage generator is separate and distinct from respective voltage sources coupled to each of the plurality of sensors; and

processing circuitry configured to generate a mathematical model of operation of the reference sensor based on correlating frequency readings obtained from the ring oscillators of the reference sensor, the reference voltage, and a reference temperature determined by the reference temperature sensor.

17. The system as recited in claim 16, wherein the processing circuitry is further configured to calibrate each of the plurality of sensors based on correlating the frequency readings from the reference sensor, the reference voltage, and the reference temperature.

18. The system as recited in claim 16, wherein the metrology control circuit further comprises an analog process monitoring circuit configured to determine operating characteristics of each of at least a subset of a plurality of transistors implemented on an integrated circuit, wherein analog process monitoring circuit is coupled to receive an input voltage from the reference voltage generator, wherein the analog process monitoring circuit is configured to provide a voltage to a gate terminal of a selected transistor from a digital-to-analog converter (DAC).

19. The system as recited in claim 18, wherein the analog process monitoring circuit includes a variable resistor configured to adjust a first voltage present on terminal of the selected transistor, wherein the variable resistor is coupled to a sigma-delta analog-to-digital converter (Σ

Δ

ADC) such that a second voltage generated across the variable resistor is input into the Σ

Δ

ADC.

20. The system as recited in claim 18, further comprising an analog test center circuit configured to receive analog signals from the analog process monitoring circuit, the reference voltage generator, and at least one or more additional analog measurement signals, wherein the analog test center circuit includes a high resolution analog-to-digital converter (ADC) configured to convert signals received from the reference voltage generator, the analog process monitoring circuit, and the one or more additional analog measurement signals into a digital format, wherein the analog test center circuit further includes an interface configure to provide access to the digital signals provided by the high resolution ADC.