Systems and methods for providing a stable wavelength reference in an integrated photonic circuit

• US 10,527,784 B1
• Filed: 11/15/2018
• Issued: 01/07/2020
• Est. Priority Date: 11/15/2018
• Status: Active Grant

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: Koste, Glen Peter, de Bock, Hendrik Pieter Jacobus, Chen, Cheng-Po
• Primary Examiner(s): Stahl, Michael
• Application Number:
  US16/192,472
• Time in Patent Office: 418 Days
• Field of Search: None
• CPC Class Codes: G01B 11/16 for measuring the deformation in a solid, e.g. optical strain gauge
• CPC Class Codes: G01B 11/165 by means of a grating deformed by the object
• CPC Class Codes: G01B 21/042 Calibration or calibration artifacts G01B3/30, G01B9/02072 take precedence
• CPC Class Codes: G01J 1/0425 using optical fibers
• CPC Class Codes: G01J 2001/4247 for testing lamps or other light sources
• CPC Class Codes: G01J 2001/446 Photodiode
• CPC Class Codes: G01K 1/14 Supports; Fastening devices; Arrangements for mounting thermometers in particular locations
• CPC Class Codes: G01K 11/3206 at discrete locations in the fibre, e.g. using Bragg scattering
• CPC Class Codes: G02B 2006/12061 Silicon
• CPC Class Codes: G02B 2006/12107 Grating
• CPC Class Codes: G02B 2006/12121 Laser
• CPC Class Codes: G02B 2006/12123 Diode
• CPC Class Codes: G02B 2006/12135 Temperature control
• CPC Class Codes: G02B 2006/12138 Sensor
• CPC Class Codes: G02B 6/02176 due to temperature fluctuations
• CPC Class Codes: G02B 6/12 of the integrated circuit kind electric integrated circuits H01L27/00
• CPC Class Codes: G02B 6/12007 forming wavelength selective elements, e.g. multiplexer, demultiplexer
• CPC Class Codes: G02B 6/124 Geodesic lenses or integrated gratings
• CPC Class Codes: G02B 6/2746 comprising non-reciprocal devices, e.g. isolators, FRM, circulators, quasi-isolators magneto-optic non-reciprocal devices G02F1/093
• CPC Class Codes: G02B 6/29338 Loop resonators
• CPC Class Codes: G02B 6/29352 : in a light guide
• CPC Class Codes: G02B 6/4266 : Thermal aspects, temperature control or temperature monitoring thermal aspect of electrical circuits H05K7/20, H05K5/0213, temperature control in general G05D23/19

Abstract

Aspects of the present disclosure are directed toward designs and methods improving optical sensing, wavelength division multiplexed (WDM) telecommunication transceivers, WDM add/drops, and spectrometer techniques that may benefit from a stable wavelength reference. The disclosed designs and methods are useful in the manufacture of a stable wavelength reference that may compensate for temperature variations.

Claims

1. An integrated photonic circuit, comprising:

a wavelength reference coupled to a source of light with spectral content and configured to estimate a first wavelength of light, wherein the wavelength reference comprises a waveguide structure, and wherein the waveguide structure is formed at least in part from silicon, silicon nitride, silica, or indium phosphide;

a temperature sensor configured to sense a temperature associated with the wavelength reference; and

a processing component configured to perform an adjustment to the estimate of the first wavelength of light based at least in part on the sensed temperature.

2. The integrated photonic circuit of claim 1, wherein the temperature sensor is communicatively coupled to additional circuitry as part of a control loop configured to change an operation in response to variations in the temperature associated with the wavelength reference.

3. The integrated photonic circuit of claim 1, wherein the processing component is configured to perform a calibration to determine a known temperature dependence of the wavelength reference, wherein the known temperature dependence of the wavelength reference is used by the processing component to at least in part determine the adjustment to the estimate of the first wavelength of light.

4. The integrated photonic circuit of claim 1, wherein the waveguide structure comprises a Bragg grating, a spiral Bragg grating, an unbalanced Mach Zehnder interferometer, a ring resonator, an edge filter, or any combination thereof.

5. The integrated photonic circuit of claim 1, comprising a photodiode or a thermistor as the temperature sensor.

6. The integrated photonic circuit of claim 1, wherein the temperature sensor is configured as a resistance temperature detectors (RTD), a thermocouple, a thermopile, a simistor, a complementary metal-oxide-semiconductor (CMOS) temperature sensor, a lightly doped silicon embedded resistor, a global temperature and energy controller, a heater, or any combination thereof.

7. The integrated photonic circuit of claim 1, wherein the wavelength reference is disposed on an underfill material comprising epoxy, thermal grease, a micro-gap pad, or any combination thereof.

8. The integrated photonic circuit of claim 1, comprising one or more additional wavelength references coupled in series with the wavelength reference.

9. A method, comprising:

operating a light source to emit light into an integrated photonic circuit comprising active circuitry that emits heat during an operation;

transmitting a first portion of the light to a wavelength reference, wherein the wavelength reference has a sensitivity to the heat from the active circuitry;

estimating a wavelength value of a second portion of the light;

determining an operating temperature associated with a time at which a peak light energy of the first portion of the light was transmitted into the wavelength reference;

determining an adjustment to apply to an estimate of the wavelength value of the second portion of the light based at least in part on the operating temperature and a known temperature dependence of the wavelength reference; and

compensating for a change in performance by the wavelength reference caused by temperature variation by applying the adjustment to the estimate of the wavelength value of the second portion of the light to generate an absolute wavelength value.

10. The method of claim 9, wherein determining the adjustment comprises referencing a look-up table comprising one or more indications of a behavior of the wavelength reference to one or more temperature variations of the operating temperature.

11. The method of claim 9, comprising defining the known temperature dependence of the wavelength reference by performing a calibration at an earlier time.

12. The method of claim 9, comprising:

monitoring a plurality of wavelengths estimated via the wavelength reference;

determining when a sweeping light source generates light at a same wavelength as the wavelength reference by determining when a plurality of amplitudes comprises a maximum wavelength estimate outputted from the wavelength reference, wherein the sweeping light source is configured to generate a plurality of light pulses at unknown wavelengths; and

calibrating the sweeping light source based at least in part on when the light is generated at the same wavelength as the wavelength reference.

13. The method of claim 9, wherein determining the operating temperature includes sensing the operating temperature using a temperature sensor disposed within a waveguide structure of the wavelength reference.

14. The method of claim 9, wherein determining the adjustment comprises:

determining a first adjustment as the adjustment in response to the operating temperature being a first value or determining a second adjustment as the adjustment in response to the operating temperature being a second value.

15. A device, comprising:

active circuitry; and

a wavelength reference coupled to the active circuitry, comprising;

a waveguide structure formed from a material sensitive to temperature variations caused by a thermal gradient associated with the active circuitry; and

a temperature sensor disposed near the waveguide structure configured to sense an ambient temperature near the waveguide structure, wherein the waveguide structure comprises a spiral Bragg grating, and wherein the temperature sensor is disposed at a center of the spiral such that the waveguide structure coils around a circumference of the temperature sensor.

16. The device of claim 15, wherein the temperature sensor is disposed on the waveguide structure, and wherein the temperature sensor is configured to sense temperature based on a change in resistance.

17. The device of claim 15, wherein the waveguide structure is formed from the material comprising silicon indium phosphide, silicon nitride, or silicon dioxide.

18. The device of claim 15, wherein the waveguide structure comprises a Bragg grating, a spiral Bragg grating, an unbalanced Mach Zehnder interferometer, a ring resonator, an edge filter, or any combination thereof.

19. The device of claim 15, wherein the temperature sensor is also used as conversion circuitry to generate electrical signals from optical signals.

20. The device of claim 15, wherein the temperature sensor comprises a photodiode and is separate from conversion circuitry of the wavelength reference.