Systems and methods for placing an imaging tool in a test and measurement tool

• US 10,530,977 B2
• Filed: 09/12/2016
• Issued: 01/07/2020
• Est. Priority Date: 09/16/2015
• Status: Active Grant

• Current Assignee: Fluke Corporation (Fortive Corp.)
• Original Assignee: Fluke Corporation (Fortive Corp.)
• Inventors: Kearsley, Duncan N., Ringsrud, Paul A., Huber, Clark N.
• Primary Examiner(s): Billah, Masum
• Application Number:
  US15/262,873
• Publication Number:
  US 20170078545A1
• Time in Patent Office: 1,212 Days
• Field of Search: 348 61
• CPC Class Codes: G01R 1/04 Housings; Supporting members; Arrangements of terminals
• CPC Class Codes: G01R 15/125 for digital multimeters
• CPC Class Codes: G01R 15/14 Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
• CPC Class Codes: G01R 15/148 involving the measuring of a magnetic field or electric field G01R15/18, G01R15/20, G01R15/24, G01R15/26 take precedence
• CPC Class Codes: H04N 23/23 from thermal infrared radiation
• CPC Class Codes: H04N 23/51 Housings
• CPC Class Codes: H04N 23/57 Mechanical or electrical details of cameras or camera modules specially adapted for being embedded in other devices
• CPC Class Codes: H04N 5/33 Transforming infrared radiation cameras or camera modules for generating image signals from infrared radiation H04N23/20; circuitry of SSIS for transforming infrared radiation into image signals H04N25/20

Abstract

Analysis systems can include both a test and measurement tool for generating measurement data representative of at least one parameter of a device under test and an imaging tool for generating image data representative of a target scene. An electrical isolation mechanism can electrically isolate a user operating the analysis tool from the test and measurement circuit through the imaging tool. The electrical isolation mechanism can include an insulating coating surrounding a part of the imaging tool having an opening proximate the imaging tool so that electromagnetic radiation can enter through the opening and reach the imaging tool. The opening can be sized so that a standard finger cannot penetrate the opening to within a predetermined distance of the imaging tool. Additionally or alternatively, a window positioned over the opening can prevent access to the imaging tool via the opening.

Claims

1. An analysis system comprising

a test and measurement tool comprising a test and measurement circuit configured to interface with a device under test and to generate measurement data representative of at least one parameter of the device under test, the test and measurement circuit being configured to electrically connect with the device under test to perform measurements at high voltages;

an imaging tool attached to the test and measurement tool and configured to receive electromagnetic radiation from a target scene and to generate image data representative of the target scene, the imaging tool comprising a sensor array and a receiving end having a lens configured to receive electromagnetic radiation from the target scene and to direct the received electromagnetic radiation to the sensor array;

a housing enclosing the test and measurement tool, including the test and measurement circuit, and the imaging tool, the housing comprising an aperture for permitting electromagnetic radiation to enter the housing so that the imaging tool receives the electromagnetic radiation, the housing comprising an insulating coating surrounding at least a portion of the imaging tool, the insulating coating having an opening proximate the imaging tool such that electromagnetic radiation can enter the opening and reach the imaging tool;

a processor in communication with the test and measurement circuit of the test and measurement tool and the imaging tool and configured to receive and process measurement data and image data; and

a window separate from the receiving end of the imaging tool and covering the opening in the insulating coating proximate the imaging tool, the window being positioned at least a first distance from the receiving end of the imaging tool;

wherein

the window covering the opening in the insulating coating of the housing prevents a user from accessing the lens of the imaging tool within the housing via the aperture in the housing; and

the first distance being associated with electrical characteristics of the window and a voltage rating of the test and measurement circuit so that a user operating the analysis system is electrically isolated from the test and measurement circuit through the imaging tool at least to the voltage rating of the test and measurement circuit via the window and the at least first distance between the window and the receiving end of the imaging tool.

2. The analysis system of claim 1, wherein the imaging tool comprises an infrared camera module, and wherein the window comprises an infrared-transmissive material.

3. The analysis system of claim 2, wherein the imaging tool further comprises a visible light camera module, and wherein the window is transparent to visible light.

4. The analysis system of claim 1, wherein the window is in thermal communication with a thermally conductive portion of the electrically isolating material.

5. The analysis system of claim 1, wherein the imaging tool is removably attached to the test and measurement tool.

6. An analysis system comprising:

a test and measurement tool comprising a test and measurement circuit configured to interface with a device under test and to generate measurement data representative of at least one parameter of the device under test, the test and measurement circuit being configured to electrically connect with the device under test to perform measurements at high voltages;

an imaging tool attached to the test and measurement tool and configured to receive electromagnetic radiation from a target scene via a receiving end of the imaging tool and to generate image data representative of the target scene, the imaging tool being electrically coupleable to the test and measurement circuit of the test and measurement tool;

a housing comprising an insulating material at least partially surrounding the imaging tool and the test and measurement circuit, the insulating material having an aperture proximate the receiving end of the imaging tool and the housing being configured to prevent a user from accessing a portion of the imaging device within the housing;

wherein

the housing comprises a frustoconical opening shaped and sized to prevent a standard finger from reaching within a predetermined distance of the receiving end of the imaging tool.

7. The analysis system of claim 6, wherein the imaging tool is fixedly attached to the test and measurement tool.

8. The analysis system of claim 6, wherein the receiving end of the imaging tool comprises a wide angle lens.

9. The analysis system of claim 6, wherein the test and measurement tool comprises a digital multimeter.

13. The analysis system of claim 6, wherein the standard finger and the predetermined distance meet International Electrotechnical Commission (IEC) 61010 standards.

10. A combination tool comprising:

a test and measurement circuit configured to interface with a device under test in order to measure at least one electrical parameter of the device under test, the test and measurement circuit being configured to electrically connect with the device under test to perform measurements at high voltages;

an imaging tool fixedly attached to and in electrical communication with the test and measurement tool, the imaging tool being configured to generate image data representative of a target scene and comprising a sensor array and a receiving end having a lens configured to receive electromagnetic radiation from the target scene and to direct the received radiation to the sensor array;

a housing comprising an insulating material and surrounding at least a portion of the test and measurement circuit and the imaging tool, the housing having an opening proximate the imaging tool so that electromagnetic radiation from the target scene travels through the opening in the housing and is received by the imaging tool; and

a window separate from the receiving end of the imaging tool and covering the opening in the housing proximate the imaging tool and the lens positioned at the receiving end of the imaging tool so that a user cannot access the lens of the imaging tool via the opening in the insulating coating;

wherein

the window prevents a standard sized finger from accessing a position within a predetermined distance from the imaging tool via the opening, the predetermined distance being associated with electrical characteristics of the window and a voltage rating of the test and measurement circuit so that a user operating the analysis system is electrically isolated from the test and measurement circuit through the imaging tool at least to the voltage rating of the test and measurement circuit via the window and the at least predetermined distance between the window and the receiving end of the imaging tool.

11. The combination tool of claim 10, wherein the imaging tool comprises an infrared camera module and the window comprises an infrared-transmissive material.

12. The combination tool of claim 10, wherein the window is in thermal communication with a thermally conductive portion of the insulating material of the housing.