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Granular dynamic test systems and methods

  • US 10,545,189 B2
  • Filed: 10/27/2016
  • Issued: 01/28/2020
  • Est. Priority Date: 10/27/2015
  • Status: Active Grant
First Claim
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1. A system comprising:

  • a plurality of scan test chains configured to perform test operations on components in a circuit partition, wherein the scan test chains perform the test operations at a first clock speed;

    a central test controller for controlling the test operations by the scan test chains; and

    an interface configured to generate instructions that direct the central test controller, wherein the interface communicates with the central test controller at the first clock speed and an external scan input at a second clock speed, wherein the second clock speed is a faster frequency than the first clock speed.

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