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Measuring operational parameters at the guided surface waveguide probe

  • US 10,559,866 B2
  • Filed: 03/01/2018
  • Issued: 02/11/2020
  • Est. Priority Date: 03/07/2017
  • Status: Active Grant
First Claim
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1. An apparatus comprising:

  • a guided surface waveguide probe configured to launch a guided surface wave along a surface of a lossy conducting medium, wherein the guided surface waveguide probe comprises;

    a charge terminal elevated to a height above the lossy conducting medium;

    a support structure that supports the charge terminal;

    at least one section of internal coil that is supported within the support structure and is coupled to an excitation source;

    a conductive tube having a first end conductively coupled to the at least one section of internal coil, wherein a second end of the conductive tube extends vertically towards the charge terminal, wherein the at least one section of the internal coil is electrically coupled to the charge terminal via the conductive tube;

    at least one sensor electrically coupled to the charge terminal or the internal coil, wherein the at least one sensor measures an operational parameter of the guided surface waveguide probe; and

    a non-conductive channel connected to the at least one sensor and monitoring equipment of the guided surface waveguide probe by which data associated with the operational parameter is communicated.

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