Measuring operational parameters at the guided surface waveguide probe
First Claim
1. An apparatus comprising:
- a guided surface waveguide probe configured to launch a guided surface wave along a surface of a lossy conducting medium, wherein the guided surface waveguide probe comprises;
a charge terminal elevated to a height above the lossy conducting medium;
a support structure that supports the charge terminal;
at least one section of internal coil that is supported within the support structure and is coupled to an excitation source;
a conductive tube having a first end conductively coupled to the at least one section of internal coil, wherein a second end of the conductive tube extends vertically towards the charge terminal, wherein the at least one section of the internal coil is electrically coupled to the charge terminal via the conductive tube;
at least one sensor electrically coupled to the charge terminal or the internal coil, wherein the at least one sensor measures an operational parameter of the guided surface waveguide probe; and
a non-conductive channel connected to the at least one sensor and monitoring equipment of the guided surface waveguide probe by which data associated with the operational parameter is communicated.
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Accused Products
Abstract
Disclosed is an exemplary guided surface waveguide probe. In one embodiment, the guided surface waveguide probe comprises a charge terminal elevated to a height above the lossy conducting medium; a support structure that supports the charge terminal; an internal coil that is supported within the support structure and is coupled to an excitation source; a conductive tube having a first end conductively coupled to the at least one section of internal coil, wherein a second end of the conductive tube extends vertically towards and is electrically coupled to the charge terminal; at least one sensor electrically coupled to the charge terminal or the internal coil, wherein the at least one sensor measures an operational parameter of the guided surface waveguide probe; and a non-conductive channel connected to the at least one sensor by which data associated with the operational parameter is communicated.
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Citations
20 Claims
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1. An apparatus comprising:
a guided surface waveguide probe configured to launch a guided surface wave along a surface of a lossy conducting medium, wherein the guided surface waveguide probe comprises; a charge terminal elevated to a height above the lossy conducting medium; a support structure that supports the charge terminal; at least one section of internal coil that is supported within the support structure and is coupled to an excitation source; a conductive tube having a first end conductively coupled to the at least one section of internal coil, wherein a second end of the conductive tube extends vertically towards the charge terminal, wherein the at least one section of the internal coil is electrically coupled to the charge terminal via the conductive tube; at least one sensor electrically coupled to the charge terminal or the internal coil, wherein the at least one sensor measures an operational parameter of the guided surface waveguide probe; and a non-conductive channel connected to the at least one sensor and monitoring equipment of the guided surface waveguide probe by which data associated with the operational parameter is communicated. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A method comprising:
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elevating a charge terminal of a guided surface waveguide probe to a height above a lossy conducting medium via a support structure of the guided surface waveguide probe; supporting at least one section of internal coil within the support structure; electrically coupling the at least one section of internal coil to an excitation source; electrically coupling a conductive tube to the at least one section of internal coil at a first end, wherein the conductive tube extends vertically towards the charge terminal at a second end; electrically coupling the conductive tube to the charge terminal; electrically coupling at least one sensor to the charge terminal or the internal coil; measuring, via the at least one sensor, an operational parameter of the guided surface waveguide probe; and communicating data associated with the operational parameter over a non-conductive channel from the at least one sensor to monitoring equipment of the guided surface waveguide probe. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17)
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18. An apparatus
a guided surface waveguide probe configured to launch a guided surface wave along a surface of a lossy conducting medium, wherein the guided surface waveguide probe comprises: -
a charge terminal elevated to a height above the lossy conducting medium, wherein the charge terminal comprises a hollow hemisphere portion that transitions into a hollow toroid portion; a support structure that supports the charge terminal at an elevation; at least one section of internal coil that is supported within the support structure and is coupled to an excitation source; a conductive tube having a first end conductively coupled to the at least one section of internal coil, wherein a second end of the conductive tube extends vertically towards the charge terminal, wherein the at least one section of the internal coil is electrically coupled to the charge terminal via the conductive tube; at least one sensor electrically coupled to the charge terminal or the internal coil, wherein the at least one sensor measures an operational parameter of the guided surface waveguide probe; monitoring equipment configured to process data associated with the operational parameter measured by the at least one sensor; and a non-conductive channel connected to the at least one sensor and the monitoring equipment by which the data associated with the operational parameter is communicated. - View Dependent Claims (19, 20)
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Specification