Deformation detection and automatic calibration for a depth imaging system
First Claim
1. A depth imaging device comprising:
- a light projector that, when in operation, emits light corresponding to a projected pattern image having a plurality of features with a known illumination pattern in the projected pattern image;
a camera that, when in operation, captures the light after reflection of the light by an environment of the depth imaging device and generates a reflected pattern image as a two-dimensional (2D) projection of the environment, the reflected pattern image including a plurality of second features that correspond to the plurality of features of the projected pattern image; and
a processor configured to;
determine a relationship of a distance or a relationship of an orientation between the plurality of features in the projected pattern image and the plurality of second features in the reflected pattern image based on an intensity dissimilarity function of the plurality of features in the projected pattern image and the plurality of second features in the reflected pattern image;
identify a set of matching features based on the relationship of the distance or the relationship of the orientation along a scanline according to a 1-dimensional (1D) scanline searching process;
identify a second set of matching features based on a second relationship of the distance or a second relationship of the orientation between the plurality of features in the projected pattern image and the plurality of second features in the reflected pattern image within a range of the scanline according to a 2-dimensional (2D) scanline searching process; and
detect a misalignment between the light projector and the camera based on the set of matching features and the second set of matching features.
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Accused Products
Abstract
Disclosed are an apparatus and a method for detecting deformation of a structured light depth imaging system and automatic re-calibration for the depth imaging system. In one embodiment, a depth imaging device includes a light projector, a camera and a processor. The light projector emits light corresponding to a projected pattern image having a plurality of features with known locations in the projected pattern image. The camera captures the light reflected by an environment of the depth imaging device and generates a reflected pattern image as a two-dimensional (2D) projection of the environment. The reflected pattern image includes a plurality of features that correspond to the features of the projected pattern image. The processor detects a misalignment for a distance or an orientation between the light projector and the camera based on a relationship between the features in the projected pattern image and the features in the reflected pattern image.
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Citations
26 Claims
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1. A depth imaging device comprising:
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a light projector that, when in operation, emits light corresponding to a projected pattern image having a plurality of features with a known illumination pattern in the projected pattern image; a camera that, when in operation, captures the light after reflection of the light by an environment of the depth imaging device and generates a reflected pattern image as a two-dimensional (2D) projection of the environment, the reflected pattern image including a plurality of second features that correspond to the plurality of features of the projected pattern image; and a processor configured to; determine a relationship of a distance or a relationship of an orientation between the plurality of features in the projected pattern image and the plurality of second features in the reflected pattern image based on an intensity dissimilarity function of the plurality of features in the projected pattern image and the plurality of second features in the reflected pattern image; identify a set of matching features based on the relationship of the distance or the relationship of the orientation along a scanline according to a 1-dimensional (1D) scanline searching process; identify a second set of matching features based on a second relationship of the distance or a second relationship of the orientation between the plurality of features in the projected pattern image and the plurality of second features in the reflected pattern image within a range of the scanline according to a 2-dimensional (2D) scanline searching process; and detect a misalignment between the light projector and the camera based on the set of matching features and the second set of matching features. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 21, 24)
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12. A method for detecting a deformation of a depth imaging device, the method comprising:
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emitting, by a light projector, light corresponding to a projected pattern image having a plurality of features with known locations in the projected pattern image; capturing, by a camera, the light reflected by environment of the depth imaging device; generating a reflected pattern image as a two-dimensional (2D) projection of the environment, the reflected pattern image including a plurality of second features that correspond to the plurality of features of the projected pattern image; determining a relationship of a distance or a relationship of an orientation between the plurality of features in the projected pattern image and the plurality of second features in the reflected pattern image based on an intensity dissimilarity function of the plurality of features in the projected pattern image and the plurality of second features in the reflected pattern image; identifying a set of matching features based on the relationship of the distance or the relationship of the orientation along a scanline according to a 1-dimensional (1D) scanline searching process; identifying a second set of matching features based on a second relationship of the distance or a second relationship of the orientation between the plurality of features in the projected pattern image and the plurality of second features in the reflected pattern image within a range of the scanline according to a 2-dimensional (2D) scanline searching process; and detecting a misalignment between the light projector and the camera based on the set of matching features and the second set of matching features. - View Dependent Claims (13, 14, 15, 16, 17, 22, 25)
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18. A head-mounted display device comprising:
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a display that, when in operation, outputs an image to an eye of a user; a light projector that, when in operation, emits light corresponding to a projected pattern image having a plurality of features with known locations in the projected pattern image; a camera that, when in operation, captures the light after reflection of the light by an environment of the head-mounted display device and generates a reflected pattern image as a two-dimensional (2D) projection of the environment, the reflected pattern image including a plurality of second features that correspond to the plurality of features of the projected pattern image; and a processor, when in operation; determines a relationship of a distance or a relationship of an orientation between the plurality of features in the projected pattern image and the plurality of second features in the reflected pattern image based on an intensity dissimilarity function of the plurality of features in the projected pattern image and the plurality of second features in the reflected pattern image; identifies a set of matching features based on the relationship of the distance or the relationship of the orientation along a scanline according to a 1-dimensional (1D) scanline searching process; identifies a second set of matching features based on a second relationship of the distance or a second relationship of the orientation between the plurality of features in the projected pattern image and the plurality of second features in the reflected pattern image within a range of the scanline according to a 2-dimensional (2D) scanline searching process; and performs a calibration process to update a set of calibration parameters based on the set of matching features and the second set of matching features. - View Dependent Claims (19, 20, 23, 26)
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Specification