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Die-level monitoring in a storage cluster

  • US 10,579,474 B2
  • Filed: 01/29/2018
  • Issued: 03/03/2020
  • Est. Priority Date: 08/07/2014
  • Status: Active Grant
First Claim
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1. A plurality of storage nodes, comprising:

  • each of the plurality of storage nodes having non-volatile solid-state storage; and

    each non-volatile solid-state storage having a controller configured to track bit errors of solid-state memory in the non-volatile solid-state storage, wherein diagnostic information for each non-volatile solid-state storage is based at least in part on the bit errors.

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