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Detecting single event upsets and stuck-at faults in RAM-based data path controllers

  • US 10,585,747 B2
  • Filed: 08/22/2018
  • Issued: 03/10/2020
  • Est. Priority Date: 05/16/2014
  • Status: Active Grant
First Claim
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1. A system, comprising:

  • a hardware processor; and

    logic integrated with the hardware processor, executable by the hardware processor, or integrated with and executable by the hardware processor, the logic being configured to;

    receive data comprising a plurality of data elements, each data element comprising one or more bits; and

    output bursts of data comprising the plurality of data elements along with a number of parity bits equal to a number of data elements in the plurality of data elements received from a first parity module to an input of a data path, each parity bit corresponding to a single data element, wherein each burst of data is restricted from being greater in length than a predetermined maximum burst size;

    a first binary sequence generator comprising at least one linear feedback shift register (LFSR) implemented in hardware, the first binary sequence generator being configured to create a binary sequence comprising a plurality of bonus bits in a pseudo-random pattern that has less than a predetermined chance of matching any sequence of bits in the data while in the data path, wherein a total length of the binary sequence is equal to or greater than the predetermined maximum burst size; and

    the first parity module configured to provide a parity calculation prior to passing the plurality of data elements to the input of the data path, the parity calculation using bits of each data element along with a bonus bit from the binary sequence to produce a corresponding parity bit for each data element.

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