Method for measuring an artefact

• US 10,591,289 B2
• Filed: 07/11/2016
• Issued: 03/17/2020
• Est. Priority Date: 07/13/2015
• Status: Active Grant

• Current Assignee: Renishaw PLC
• Original Assignee: Renishaw PLC
• Inventors: McLean, Calum Conner, McLean, Ian William
• Primary Examiner(s): Rahman, Md M
• Application Number:
  US15/577,191
• Publication Number:
  US 20180156608A1
• Time in Patent Office: 1,345 Days
• Field of Search: 356623
• CPC Class Codes: G01B 11/002 for measuring two or more coordinates
• CPC Class Codes: G01B 11/005 coordinate measuring machines
• CPC Class Codes: G01B 11/24 for measuring contours or curvatures
• CPC Class Codes: G01B 11/2518 Projection by scanning of the object
• CPC Class Codes: G01B 21/042 Calibration or calibration artifacts G01B3/30, G01B9/02072 take precedence
• CPC Class Codes: G06T 2207/30164 Workpiece; Machine component
• CPC Class Codes: G06T 7/0004 Industrial image inspection
• CPC Class Codes: G06T 7/75 involving models

Abstract

A method of measuring at least one point on an artefact to be inspected that is located within a positioning apparatus'"'"' measurement volume, the method comprising, obtaining at least two images of the artefact obtained from different perspectives and, based on a given nominal location of a predetermined point to be measured within said positioning apparatus'"'"' measurement volume, determine the location of said predetermined point in each of the at least two images.

Claims

1. A method of inspecting an artefact that is located within a positioning apparatus measurement volume, the method comprising:

receiving at least one image of the artefact that is located within the positioning apparatus measurement volume and which is obtained by inspecting the artefact; and

,

for a predetermined point on the artefact to be measured, determining the location of said predetermined point in said at least one image based on a given nominal location of the predetermined point within the positioning apparatus measurement volume, where the given nominal location is an expected location of the predetermined point within the positioning apparatus measurement volume.

2. The method as claimed in claim 1, comprising determining the actual location of said predetermined point in said positioning apparatus measurement volume based on the determined location of the predetermined point in said at least one image.

3. The method as claimed in claim 2, in which determining the actual location comprises triangulating the actual location of said predetermined point in said positioning apparatus measurement volume.

4. The method as claimed in claim 1, comprising obtaining at least two images of the artefact and, based on the given nominal location of the predetermined point to be measured within said positioning apparatus measurement volume, determining the location of said predetermined point in each of the at least two images.

5. The method as claimed in claim 4, in which said predetermined point comprises a point on an edge of said artefact, and in which said at least two images comprise contrast/silhouette images of the edge.

6. The method as claimed in claim 1, comprising receiving an indication of a predetermined point on the artefact and determining the nominal location of said predetermined point within said positioning apparatus measurement volume.

7. The method as claimed in claim 6, in which said indication of the predetermined point on the artefact comprises an identified point on a computer representation of the artefact.

8. The method as claimed in claim 1, in which said predetermined point comprises a point on an edge of said artefact.

9. The method as claimed in claim 1, in which said determining the location of said predetermined point in the at least one image comprises determining a search line along which to search within the image, and identifying where along said search line the image meets predetermined criteria.

10. The method as claimed in claim 9, in which said predetermined criteria comprises a threshold rate of change in a property of the image.

11. The method as claimed in claim 9, in which said search line is derived from a plane containing the perspective centres of at least two images and said nominal location of said predetermined point.

12. The method as claimed in claim 11, comprising projecting a nominal direction vector associated with the predetermined point to be measured into the plane containing the perspective centres of the at least two images and said nominal location of said predetermined point.

13. The method as claimed in claim 9, in which determining the search line comprises projecting a nominal direction vector associated with the predetermined point to be measured into the at least one image.

14. The method as claimed in claim 13, in which projecting the nominal direction vector is done via orthographic and/or perspective projection.

15. The method as claimed in claim 9, in which the search line is bounded.

16. The method as claimed in claim 9, comprising determining whether the angle of intersection between said search line and the imaged surface of the artefact meets predetermined threshold criteria.

17. The method as claimed in claim 1, comprising automatically determining the perspective from which to obtain the at least one image based on the nominal location of said predetermined point.

18. The method as claimed in claim 1, comprising determining the locations of a plurality of predetermined points in said at least one image, based on given nominal locations of the plurality of predetermined points to be measured within said positioning apparatus measurement volume.

19. The method as claimed in claim 1, in which the image of the artefact is obtained by inspecting the artefact with an imaging device capturing at least one image of the artefact.

20. A non-transitory computer readable medium bearing computer program code comprising instructions configured such that when executed by a processor device cause the processor device to execute the method of claim 1.

21. An apparatus comprising at least one processor device configured to:

(i) receive at least one image of an artefact that is located within a positioning apparatus measurement volume and which is obtained by inspecting the artefact, and, (ii) for a predetermined point on the artefact to be measured, find said predetermined point in said at least one image based on a given nominal location of the predetermined point within the positioning apparatus measurement volume, where the given nominal location is an expected location of the predetermined point within the positioning apparatus measurement volume.

22. The apparatus as claimed in claim 21 comprising at least one imaging device configured to capture at least one image of the artefact.