Test bench for simulating the electrical response of a wideband lambda sensor
First Claim
1. A test bench for a control system configured to control a wideband lambda sensor, the test bench having an electrical circuit comprising:
- a first terminal; and
a second terminal, a pump voltage is applied by the control system such that a drop across the electrical circuit is caused,wherein the test bench is configured to calculate an actual value, which represents an oxygen concentration in a measuring gap of a wideband lambda sensor or an indicator value from which the oxygen concentration is derived based on a current generated by the pump voltage in the electric circuit,wherein the test bench provides the actual value at a data output of the test bench so that the actual value is read out by the control system, andwherein, in the electrical circuit, a first diode and a second diode are connected in parallel such that a current flows through the first diode at a first polarity of the pump voltage and a current flows through the second diode at a second polarity of the pump voltage.
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Accused Products
Abstract
A test bench for a control system for controlling a wideband lambda sensor, which is configured to calculate an actual value, which represents an oxygen concentration in a measuring gap of a wideband lambda sensor or an indicator value from which the oxygen concentration can be derived, with consideration of a current generated by a pump voltage in an electrical circuit. In order to simulate the electrical response of a pump cell of the wideband lambda sensor, a first diode and a second diode are connected in parallel in the electrical circuit such that a current flows through the first diode at a first polarity of the pump voltage and a current flows through the second diode at a second polarity of the pump voltage.
12 Citations
14 Claims
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1. A test bench for a control system configured to control a wideband lambda sensor, the test bench having an electrical circuit comprising:
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a first terminal; and a second terminal, a pump voltage is applied by the control system such that a drop across the electrical circuit is caused, wherein the test bench is configured to calculate an actual value, which represents an oxygen concentration in a measuring gap of a wideband lambda sensor or an indicator value from which the oxygen concentration is derived based on a current generated by the pump voltage in the electric circuit, wherein the test bench provides the actual value at a data output of the test bench so that the actual value is read out by the control system, and wherein, in the electrical circuit, a first diode and a second diode are connected in parallel such that a current flows through the first diode at a first polarity of the pump voltage and a current flows through the second diode at a second polarity of the pump voltage. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A test method for a control system configured to control a broadband lambda sensor, the method comprising:
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connecting the control system to an electrical circuit such that a pump voltage, which is controlled by the control system and is provided for application to a pump cell of the wideband lambda sensor, drops across the electrical circuit; calculating, based on the pump voltage, an actual value that represents an oxygen concentration in a measuring gap of a wideband lambda sensor or an indicator value from which the oxygen concentration is derived; and connecting, in the electrical circuit, a first diode and a second diode in parallel such that a current flows through the first diode at a first polarity of the pump voltage and a current flows through the second diode at a second polarity of the pump voltage. - View Dependent Claims (10, 11, 12, 13, 14)
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Specification