Methods and apparatuses for self-trimming of a semiconductor device

• US 10,600,494 B2
• Filed: 04/05/2018
• Issued: 03/24/2020
• Est. Priority Date: 04/05/2018
• Status: Active Grant

• Current Assignee: Micron Technology, Inc.
• Original Assignee: Micron Technology, Inc.
• Inventors: Jimenez-Olivares, Miguel, Kuzmenka, Maksim
• Primary Examiner(s): Lappas, Jason
• Application Number:
  US15/946,456
• Publication Number:
  US 20190311773A1
• Time in Patent Office: 719 Days
• Field of Search: 36518907, 36518525
• CPC Class Codes: G11C 11/4074 Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
• CPC Class Codes: G11C 2207/2254 Calibration
• CPC Class Codes: G11C 29/021 in voltage or current generators
• CPC Class Codes: G11C 29/028 with adaption or trimming of parameters
• CPC Class Codes: G11C 29/50008 of impedance
• CPC Class Codes: G11C 5/147 Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops G11C5/141 takes precedence

Abstract

Methods and apparatuses are provided for self-trimming of a semiconductor device. An example apparatus includes a semiconductor device including a self-trimming circuit configured to receive a reference voltage and a test command signal. The self-trimming circuit is configured to convert the reference voltage to a target voltage based on the test command signal and further configured to adjust a voltage trim code until an internal voltage matches the target voltage to determine a trim level associated with the internal voltage.

Claims

1. An apparatus comprising:

a semiconductor device comprising a self-trimming circuit configured to receive a reference voltage and a test command signal, the self-trimming circuit configured to convert the reference voltage to a target voltage based on the test command signal and further configured to adjust a voltage trim code until an internal voltage matches the target voltage to determine a trim level associated with the internal voltage.

2. The apparatus of claim 1, wherein the self-trimming circuit comprises a reference voltage regulator configured to adjust an output voltage in response to the voltage trim code, wherein the output voltage is the internal voltage.

3. The apparatus of claim 1, wherein the self-trimming circuit comprises a control circuit configured to decode the test command signal to determine a target voltage code, wherein the target voltage code is used to determine the target voltage.

4. The apparatus of claim 3, wherein the self-trimming circuit further comprises a digital-to-analog converter configured to receive the reference voltage and to convert the reference voltage to the target voltage based on the target voltage code.

5. The apparatus of claim 3, wherein the self-trimming circuit further comprises a comparator configured to compare the target voltage with the internal voltage and to provide a stop signal having a value based on the comparison, wherein the control circuit is configured to adjust the voltage trim code based on a value of the stop signal.

6. The apparatus of claim 3, wherein the control circuit is configured to decode the test command signal to retrieve selection of one of a custom target voltage code or a default target voltage code as the target voltage code.

7. The apparatus of claim 6, wherein the self-trimming circuit further comprises a metal option bank configured to provide the default target voltage code based on a voltage identifier in the test command signal.

8. The apparatus of claim 6, wherein the control circuit is configured to decode the test command signal to retrieve the custom target voltage code.

9. A method comprising:

receiving a reference voltage and a test command signal at a semiconductor device;

converting the reference voltage to a target voltage based on the test command signal at the semiconductor device; and

adjusting a voltage trim code until an internal voltage matches the target voltage to determine a trim level associated with the internal voltage.

10. The method of claim 9, further comprising adjusting an output voltage of a voltage regulator in response to the voltage trim code, wherein the output voltage is the internal voltage.

11. The method of claim 9, further comprising decoding the test command signal to determine a target voltage code, wherein the target voltage code is used to determine the target voltage.

12. The method of claim 11, further comprising:

comparing the target voltage with the internal voltage; and

providing a stop signal having a value based on the comparison, wherein adjustment of the voltage trim code is based on a value of the stop signal.

13. The method of claim 11, further comprising decoding the test command signal to retrieve selection of one of a custom target voltage code or a default target voltage code as the target voltage code.