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Methods and apparatuses for self-trimming of a semiconductor device

  • US 10,600,494 B2
  • Filed: 04/05/2018
  • Issued: 03/24/2020
  • Est. Priority Date: 04/05/2018
  • Status: Active Grant
First Claim
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1. An apparatus comprising:

  • a semiconductor device comprising a self-trimming circuit configured to receive a reference voltage and a test command signal, the self-trimming circuit configured to convert the reference voltage to a target voltage based on the test command signal and further configured to adjust a voltage trim code until an internal voltage matches the target voltage to determine a trim level associated with the internal voltage.

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