Visible X-ray indication and detection system for X-ray backscatter applications

• US 10,605,750 B2
• Filed: 03/14/2017
• Issued: 03/31/2020
• Est. Priority Date: 07/22/2014
• Status: Active Grant

• Current Assignee: The Boeing Co.
• Original Assignee: The Boeing Co.
• Inventors: Georgeson, Gary E.
• Primary Examiner(s): Ho, Allen C.
• Application Number:
  US15/458,025
• Publication Number:
  US 20170184517A1
• Time in Patent Office: 1,113 Days
• Field of Search: 378 44- 50, 378 86- 90, 378 987, 378 57- 59
• CPC Class Codes: G01N 2223/053 back scatter
• CPC Class Codes: G01N 2223/0766 X-ray fluorescence with indicator, tags
• CPC Class Codes: G01N 2223/32 adjustments of elements during operation
• CPC Class Codes: G01N 23/203 Measuring back scattering
• CPC Class Codes: G01N 23/223 by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
• CPC Class Codes: G01T 1/04 Chemical dosimeters G01T1/06, G01T1/08 take precedence
• CPC Class Codes: G01T 1/10 Luminescent dosimeters
• CPC Class Codes: G01T 1/16 Measuring radiation intensity G01T1/29 takes precedence ; self-powered detectors G01T3/006; using an ionisation chamber filled with a liquid or solid, e.g. frozen liquid, dielectric G01T3/008
• CPC Class Codes: G01T 1/20 with scintillation detectors
• CPC Class Codes: G01T 7/00 Details of radiation-measuring instruments
• CPC Class Codes: G01V 5/22 Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
• CPC Class Codes: G01V 5/222 measuring scattered radiation

Abstract

An X-ray backscatter indication and detection system, including an object disposed with respect to a target area targeted by X-rays, such that X-rays that backscatter from the target area strike the surface of the object. The surface of the object includes an X-ray sensitive indicator substance that fluoresces with a visible light when contacted by backscattered X-rays.

Claims

1. A system, comprising:

an X-ray generator having a longitudinal axis;

an object disposed with respect to a target area targeted by X-rays from the X-ray generator, such that backscattered X-rays that backscatter from the target area strike a first surface of the object, wherein the first surface of the object includes an X-ray fluorescent indicator substance that fluoresces with a visible light when contacted by backscattered X-rays;

wherein the object comprises;

a first panel in front of but to a first side of the X-ray generator, the first panel being about perpendicular to the longitudinal axis of the X-ray generator;

a second panel disposed in front of but to a second side of the X-ray generator, opposite the first side, the second panel being about perpendicular to the longitudinal axis of the X-ray generator;

a third panel about perpendicular to the first panel at a first far end of the first panel, relative to the X-ray generator; and

a fourth panel about perpendicular to the second panel at a second far end of the second panel, relative to the X-ray generator.

2. The system of claim 1, wherein said X-ray fluorescent indicator substance that fluoresces is a Q-dot solution.

3. The system of claim 1, further comprising an additional X-ray fluorescent indicator substance.

4. The system of claim 1, further comprising:

an image capture device operatively disposed to detect the visible light resulting from fluorescence of the X-ray fluorescent indicator substance.

5. The system of claim 4, further comprising:

a computer in communication with the image capture device, that stores an image of the visible light and performs an analysis of the image.

6. The system of claim 5, wherein the X-ray generator is in communication with a computer, and the computer is in communication with the image capture device, wherein the computer modifies operation of the X-ray generator based on the analysis of the image of the visible light taken by the image capture device.

7. The system of claim 4, wherein the image capture device comprises one of a visible light camera, a charged couple device (CCD), and a complimentary metal-oxide semiconductor (CMOS) camera.

8. The system of claim 1, wherein the X-ray fluorescent indicator substance is disposed on a second surface of the third panel.

9. The system of claim 1, wherein the X-ray fluorescent indicator substance is disposed on a second surface of the fourth panel.

10. The system of claim 1, wherein the X-ray fluorescent indicator substance is disposed on surfaces of both the third panel and the fourth panel.

11. The system of claim 1, wherein the X-ray fluorescent indicator substance is disposed on a second surface of the first panel.

12. The system of claim 1, wherein the X-ray fluorescent indicator substance is disposed on a second surface of the second panel.

13. The system of claim 1, wherein the X-ray fluorescent indicator substance is disposed on surfaces of the first panel and the second panel.

14. The system of claim 1, wherein the X-ray fluorescent indicator substance is disposed on surfaces of the first panel, the second panel, the third panel, and the fourth panel.

15. The system of claim 1, further comprising:

a fifth panel behind the target area relative to the X-ray generator and opposite the first panel and the second panel relative to the target area.

16. The system of claim 15, wherein the X-ray fluorescent indicator substance is disposed on the fifth panel.

17. The system of claim 16, wherein the X-ray fluorescent indicator substance is disposed on the third panel, the fourth panel, and the fifth panel.

18. The system of claim 1, wherein at least one of the first panel, the second panel, the third panel, and the fourth panel comprises a different type of X-ray detector relative to the X-ray fluorescent indicator substance.

19. A method of detecting backscatter X-rays using an X-ray backscatter indication and detection system, the method comprising:

providing an X-ray generator having a longitudinal axis;

providing an object comprising;

a first panel disposed forward, but to a first side, of the X-ray generator, wherein the first panel is about perpendicular to the longitudinal axis of the X-ray generator;

a second panel disposed forward, but to a second side, of the X-ray generator, opposite the first side, wherein the second panel is about perpendicular to the longitudinal axis of the X-ray generator;

a third panel disposed about perpendicular to the first panel, wherein the third panel is disposed at a first far end of the first panel, relative to the X-ray generator; and

a fourth panel disposed about perpendicular to the second panel, wherein the fourth panel is disposed at a second far end of the second panel, relative to the X-ray generator;

disposing the object with respect to a target area targeted by X-rays from the X-ray generator, such that backscattered X-rays that backscatter from the target area strike a surface of the object, wherein the surface of the object includes an X-ray fluorescent indicator substance that fluoresces with a visible light when contacted by backscattered X-rays;

directing, using the X-ray generator, X-rays towards the target area;

detecting an intensity of fluorescence of the X-ray fluorescent indicator substance; and

using the intensity of fluorescence to characterize a flux of backscatter X-rays that backscatter from the target area.

20. A method, comprising:

directing X-rays towards a target area, the target area disposed along a longitudinal axis of the X-rays, wherein an object is disposed adjacent the longitudinal axis of the X-rays, the object comprising;

a first panel disposed to a first side of the X-rays, wherein the first panel is about perpendicular to the longitudinal axis of the X-rays;

a second panel disposed to a second side of the X-rays, opposite the first side, wherein the second panel is about perpendicular to the longitudinal axis of the X-rays;

a third panel disposed about perpendicular to the first panel, wherein the third panel is disposed at a first far end of the first panel, relative to the X-rays; and

a fourth panel disposed about perpendicular to the second panel, wherein the fourth panel is disposed at a second far end of the second panel, relative to the X-rays, and wherein the first panel, the second panel, the third panel, and the fourth panel comprise an X-ray fluorescent material;

backscattering the X-rays from the target area, wherein backscattered X-rays strike the X-ray fluorescent material, the X-ray fluorescent material producing emitted light when contacted by the backscattered X-rays;

after backscattering, detecting an intensity of the emitted light; and

after detecting, using the intensity of the emitted light to characterize a flux of backscattered X-rays from the target area.