Aperture scanning Fourier ptychographic imaging

• US 10,606,055 B2
• Filed: 04/20/2018
• Issued: 03/31/2020
• Est. Priority Date: 07/31/2013
• Status: Active Grant

• Current Assignee: California Institute of Technology
• Original Assignee: California Institute of Technology
• Inventors: Horstmeyer, Roarke W., Zheng, Guoan, Ou, Xiaoze, Yang, Changhuei
• Primary Examiner(s): Hansen, Jonathan M
• Application Number:
  US15/959,050
• Publication Number:
  US 20180307017A1
• Time in Patent Office: 711 Days
• CPC Class Codes: G01N 23/205 using diffraction cameras
• CPC Class Codes: G01T 1/185 with ionisation chamber arrangements
• CPC Class Codes: G01T 3/008 using an ionisation chamber filled with a gas, liquid or solid, e.g. frozen liquid, dielectric G01T3/006 takes precedence
• CPC Class Codes: G02B 21/0032 Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers G02B21/0036 - G02B21/008; means for illumination of specimens in general G02B21/06
• CPC Class Codes: G02B 21/0048 scanning mirrors, e.g. rotating or galvanomirrors, MEMS mirrors
• CPC Class Codes: G02B 21/0056 based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
• CPC Class Codes: G02B 21/006 focusing arrangements; selection of the plane to be imaged
• CPC Class Codes: G02B 21/008 Details of detection or image processing, including general computer control
• CPC Class Codes: G02B 21/16 adapted for ultraviolet illumination ; Fluorescence microscopes G02B21/0076 takes precedence
• CPC Class Codes: G02B 21/367 providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
• CPC Class Codes: G02B 27/46 Systems using spatial filters
• CPC Class Codes: G02B 27/58 Optics for apodization or superresolution; Optical synthetic aperture systems

Abstract

Certain aspects pertain to aperture-scanning Fourier ptychographic imaging devices comprising an aperture scanner that can generate an aperture at different locations at an intermediate plane of an optical arrangement, and a detector that can acquire lower resolution intensity images for different aperture locations, and wherein a higher resolution complex image may be constructed by iteratively updating regions in Fourier space with the acquired lower resolution images.

Claims

1. A Fourier ptychographic imaging device, comprising:

a first optical element configured to receive light propagated from a sample being imaged during operation;

an aperture scanner configured to sequentially provide an aperture at a plurality of aperture locations at a Fourier plane of the sample plane and configured to receive at the aperture light propagated from the first optical element, wherein the plurality of aperture locations correspond to overlapping regions in the Fourier domain;

a second optical element configured to receive light propagated from the first optical element by the aperture of the aperture scanner;

at least one image sensor configured to take one or more intensity images while receiving light propagated from the second optical element, wherein image data of each of the one or more intensity images is measured while the aperture is located at one of the plurality of aperture locations at the Fourier plane; and

at least one processor in electrical communication with the at least one image sensor to receive the one or more intensity images, the processor configured to;

construct a complex image of the sample using image data from the one or more intensity images, wherein the complex image has higher resolution than the one or more intensity images; and

correct for aberration in the complex image to generate a substantially aberration-free complex image.

2. The Fourier ptychographic imaging device of claim 1, wherein the processor is configured to construct the complex image by iteratively updating overlapping regions in the Fourier domain with data derived from the one or more intensity images.

3. The Fourier ptychographic imaging device of claim 1, wherein the processor is further configured to simultaneously correct for aberration while constructing the complex image.

4. The Fourier ptychographic imaging device of claim 1, wherein the aperture scanner is a spatial light modulator.

5. The Fourier ptychographic imaging device of claim 1, wherein the sample is illuminated from a plurality of illumination angles successively while the at least one image sensor takes the one or more intensity images.

6. The Fourier ptychographic imaging device of claim 1, wherein the sample is illuminated by a plurality of wavelengths successively while the at least one image sensor takes the one or more intensity images.

7. The Fourier ptychographic imaging device of claim 1, wherein the overlapping regions in the Fourier domain overlap by at least about 70% in area.

8. The Fourier ptychographic imaging device of claim 1, wherein the overlapping regions in the Fourier domain overlap by between 20% and 90% in area.

9. The Fourier ptychographic imaging device of claim 1, wherein an illumination source illuminating the sample and the first optical element are on one side of the sample being imaged.

10. A Fourier ptychographic imaging method, comprising:

causing an aperture scanner to sequentially generate an aperture at a plurality of aperture locations at a Fourier plane of the sample plane, wherein the aperture is configured to receive light propagated from a sample being illuminated, wherein the plurality of aperture locations correspond to overlapping regions in the Fourier domain;

causing at least one image sensor to take a plurality of intensity measurements while receiving light propagated from the aperture of the aperture scanner by a lens, each intensity measurement taken while the aperture is located at one of the plurality of aperture locations;

computationally constructing a complex image of the sample by iteratively updating the overlapping regions in the Fourier domain data derived from the intensity measurements; and

correcting for aberration to construct a substantially aberration-free complex image.

11. The Fourier ptychographic imaging method of claim 10, further comprising simultaneously correcting for aberration while constructing the complex image.

12. A Fourier ptychographic imaging method comprising:

causing an aperture scanner to sequentially generate an aperture at a plurality of aperture locations at a Fourier plane of the sample plane, wherein the aperture is configured to receive light propagated from a sample being illuminated, wherein the aperture locations correspond to overlapping regions in the Fourier domain;

causing at least one image sensor to take a plurality of intensity measurements while receiving light propagated from the aperture of the aperture scanner by a focusing lens, each intensity measurement taken while the aperture is located at one of the plurality of aperture locations;

constructing a complex image of the sample by iteratively updating the overlapping regions in the Fourier domain with the intensity measurements; and

causing an illumination source to illuminate the sample while the at least one image sensor takes the plurality of intensity measurements.

13. The Fourier ptychographic imaging method of claim 12, wherein the sample is illuminated from a plurality of illumination angles successively while the at least one image sensor takes the one or more intensity measurements.

14. A Fourier ptychographic imaging device, comprising:

a first optical element configured to receive light propagated from a sample being imaged during operation;

an aperture scanner configured to sequentially provide an aperture at a plurality of aperture locations at a Fourier plane of the sample plane and configured to receive light propagated from the first optical element, wherein the plurality of aperture locations correspond to overlapping regions in the Fourier domain, and wherein the aperture scanner comprises a plate of opaque material having a light transmissive region and a mechanism for moving the plate of opaque material to shift the light transmissive region to the plurality of aperture locations;

a second optical element configured to receive light propagated from the first optical element by the aperture of the aperture scanner; and

at least one image sensor configured to take one or more intensity images while receiving light from the second optical element, wherein each of the one or more intensity images is taken while the aperture is located at one of the plurality of aperture locations at the Fourier plane.

15. The Fourier ptychographic imaging device of claim 14, wherein the light transmissive region is a hole in the plate of opaque material.

16. The Fourier ptychographic imaging device of claim 14,

further comprising a processor in communication with the at least one image sensor to receive the one or more intensity images,

wherein the processor is configured to construct a complex image of the sample using image data from the one or more intensity images, and

wherein the complex image has higher resolution than the one or more intensity images.

17. The Fourier ptychographic imaging device of claim 16, wherein the processor is configured to construct the complex image by iteratively updating the overlapping regions in the Fourier domain with data derived from the one or more intensity images.

18. The Fourier ptychographic imaging device of claim 16, wherein the processor is further configured to correct for aberration to generate a substantially aberration-free complex image.