Self-evaluating array of memory
First Claim
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1. A computer-implemented method comprising:
- applying, by a memory controller, a first voltage to a memory in a neural network, wherein the memory includes one or more memory cells;
determining that a first memory cell in the memory is faulty at the first voltage, wherein the first voltage is a minimum operating voltage for the memory, and wherein the first memory cell is determined to be faulty when the first memory cell does not transition a logic value at the first voltage;
identifying a first factor in the neural network, wherein the first factor has a low criticality in the neural network;
determining to store the first factor in the first memory cell;
storing the first factor directly in the first memory cell; and
operating all of the one or more memory cells at the first voltage.
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Abstract
A first voltage may be applied to a memory in a neural network. The memory may include one or more memory cells. A processor may determine that a first memory cell in the memory is faulty at the first voltage. The first voltage may be a low voltage. The processor may identify a first factor in the neural network. The first factor may have a low criticality in the neural network. The processor may determine to store the first factor in the first memory cell. The processor may store the first factor in the first memory cell.
22 Citations
17 Claims
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1. A computer-implemented method comprising:
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applying, by a memory controller, a first voltage to a memory in a neural network, wherein the memory includes one or more memory cells; determining that a first memory cell in the memory is faulty at the first voltage, wherein the first voltage is a minimum operating voltage for the memory, and wherein the first memory cell is determined to be faulty when the first memory cell does not transition a logic value at the first voltage; identifying a first factor in the neural network, wherein the first factor has a low criticality in the neural network; determining to store the first factor in the first memory cell; storing the first factor directly in the first memory cell; and operating all of the one or more memory cells at the first voltage. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A system comprising:
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a memory; and a processor in communication with the memory, the processor being configured to perform operations comprising; applying, by a memory controller, a first voltage to a memory in a neural network, wherein the memory includes one or more memory cells; determining that a first memory cell in the memory is faulty at the first voltage, wherein the first voltage is a minimum operating voltage for the memory, and wherein the first memory cell is determined to be faulty when the first memory cell does not transition a logic value at the first voltage; identifying a first factor in the neural network, wherein the first factor has a low criticality in the neural network; determining to store the first factor in the first memory cell; storing the first factor directly in the first memory cell, and operating all of the one or more memory cells at the first voltage. - View Dependent Claims (12, 13, 14, 15, 16, 17)
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Specification