Aided image reconstruction
First Claim
1. A system configured to determine boundaries of one or more patterned features formed on a specimen from an unresolved image of the one or more patterned features on the specimen, comprising:
- an inspection subsystem comprising at least an energy source and a detector, wherein the energy source is configured to generate energy that is directed to a specimen, wherein the detector is configured to detect energy from the specimen and to generate images responsive to the detected energy, and wherein one or more patterned features formed on the specimen are unresolved in the images generated by the detector; and
one or more computer subsystems configured for;
generating a difference image for the one or more patterned features by subtracting a reference image from one of the images generated by the detector for the one or more patterned features;
comparing the difference image to different simulated difference images, wherein the different simulated difference images are generated by simulating images generated for the one or more patterned features formed on the specimen with different perturbations, respectively;
based on results of the comparing, assigning an amplitude to each of the different perturbations; and
determining one or more boundaries of the one or more patterned features formed on the specimen by applying the different perturbations to one or more designed boundaries of the one or more patterned features with the assigned amplitudes.
1 Assignment
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Accused Products
Abstract
Methods and systems for determining boundaries of patterned features formed on a specimen from an unresolved image of the specimen are provided. One system includes computer subsystem(s) configured for comparing a difference image in which patterned feature(s) are unresolved to different simulated images. The different simulated images are generated by simulating difference images generated for the patterned feature(s) formed on the specimen with different perturbations, respectively. The computer subsystem(s) are configured for, based on the comparing, assigning an amplitude to each of the different perturbations. The computer subsystem(s) are further configured for determining one or more boundaries of the patterned feature(s) formed on the specimen by applying the different perturbations to one or more designed boundaries of the patterned feature(s) with the assigned amplitudes.
20 Citations
18 Claims
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1. A system configured to determine boundaries of one or more patterned features formed on a specimen from an unresolved image of the one or more patterned features on the specimen, comprising:
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an inspection subsystem comprising at least an energy source and a detector, wherein the energy source is configured to generate energy that is directed to a specimen, wherein the detector is configured to detect energy from the specimen and to generate images responsive to the detected energy, and wherein one or more patterned features formed on the specimen are unresolved in the images generated by the detector; and one or more computer subsystems configured for; generating a difference image for the one or more patterned features by subtracting a reference image from one of the images generated by the detector for the one or more patterned features; comparing the difference image to different simulated difference images, wherein the different simulated difference images are generated by simulating images generated for the one or more patterned features formed on the specimen with different perturbations, respectively; based on results of the comparing, assigning an amplitude to each of the different perturbations; and determining one or more boundaries of the one or more patterned features formed on the specimen by applying the different perturbations to one or more designed boundaries of the one or more patterned features with the assigned amplitudes. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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17. A non-transitory computer-readable medium, storing program instructions executable on a computer system for performing a computer-implemented method for determining boundaries of one or more patterned features formed on a specimen from an unresolved image of the one or more patterned features on the specimen, wherein the computer-implemented method comprises:
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generating a difference image for one or more patterned features formed on a specimen by subtracting a reference image from an image generated by a detector for the one or more patterned features, wherein an inspection subsystem comprises at least an energy source and the detector, wherein the energy source is configured to generate energy that is directed to the specimen, wherein the detector is configured to detect energy from the specimen and to generate images responsive to the detected energy, and wherein the one or more patterned features formed on the specimen are unresolved in the images generated by the detector; comparing the difference image to different simulated difference images, wherein the different simulated difference images are generated by simulating images generated for the one or more patterned features formed on the specimen with different perturbations, respectively; based on results of the comparing, assigning an amplitude to each of the different perturbations; and determining one or more boundaries of the one or more patterned features formed on the specimen by applying the different perturbations to one or more designed boundaries of the one or more patterned features with the assigned amplitudes.
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18. A computer-implemented method for determining boundaries of one or more patterned features formed on a specimen from an unresolved image of the one or more patterned features on the specimen, comprising:
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generating a difference image for one or more patterned features formed on a specimen by subtracting a reference image from an image generated by a detector for the one or more patterned features, wherein an inspection subsystem comprises at least an energy source and the detector, wherein the energy source is configured to generate energy that is directed to the specimen, wherein the detector is configured to detect energy from the specimen and to generate images responsive to the detected energy, and wherein the one or more patterned features formed on the specimen are unresolved in the images generated by the detector; comparing the difference image to different simulated difference images, wherein the different simulated difference images are generated by simulating images generated for the one or more patterned features formed on the specimen with different perturbations, respectively; based on results of the comparing, assigning an amplitude to each of the different perturbations; and determining one or more boundaries of the one or more patterned features formed on the specimen by applying the different perturbations to one or more designed boundaries of the one or more patterned features with the assigned amplitudes, wherein said generating, said comparing, said assigning, and said determining are performed by one or more computer subsystems.
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Specification