Semiconductor device for generating a control temperature code
First Claim
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1. A semiconductor device comprising:
- a latch code generation circuit configured to generate latch codes by latching a temperature code in synchronization with a latch signal when an internal operation is performed; and
a period end signal generation circuit configured to generate a period end signal for updating a control temperature code when the latch codes are the same, wherein bits included in the latch signal are sequentially generated in synchronization with a counting signal which is sequentially counted for a preset period.
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Abstract
A semiconductor device includes a control temperature code generation circuit configured to generate latch codes by latching a temperature code until a number of the latch codes generated include a same combination, and configured to update a control temperature code when the number of the latch codes generated include the same.
6 Citations
26 Claims
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1. A semiconductor device comprising:
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a latch code generation circuit configured to generate latch codes by latching a temperature code in synchronization with a latch signal when an internal operation is performed; and a period end signal generation circuit configured to generate a period end signal for updating a control temperature code when the latch codes are the same, wherein bits included in the latch signal are sequentially generated in synchronization with a counting signal which is sequentially counted for a preset period. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A semiconductor device comprising:
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a control temperature code generation circuit configured to generate latch codes by latching a temperature code when an internal operation is performed, and generate a control temperature code which is updated, based on the latch codes being the same; and a code output circuit configured to output the control temperature code as a temperature output code when a temperature read command is generated. - View Dependent Claims (14, 15, 16, 17, 18, 19)
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20. A semiconductor device comprising:
a control temperature code generation circuit configured to generate latch codes by latching, respectively, bits of a temperature code until a number of the latch codes generated include a same combination of bits, and configured to update a control temperature code when the number of the latch codes generated include the same combination of bits, wherein the bits of the temperature code are latched in synchronization with latch signals, the latch signals sequentially generated based on an oscillating signal and sequentially counting bits of a counting signal, for a period of the oscillating signal. - View Dependent Claims (21, 22, 23, 24, 25, 26)
Specification