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Double-pulse test systems and methods

  • US 10,640,003 B2
  • Filed: 06/08/2017
  • Issued: 05/05/2020
  • Est. Priority Date: 06/08/2017
  • Status: Active Grant
First Claim
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1. A double-pulse test method, comprising:

  • by a processor,operating a device under test (DUT), coupled to an inductive load defined by an air-core inductor, according to a double-pulse test schedule; and

    calculating a corrected collector current of the DUT from a difference between (i) a measured collector current of the DUT and (ii) a change in current through the air-core inductor that is based on a first sensed voltage across a supply capacitor and a second sensed voltage across the DUT.

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