High-temperature magnetostrictive guided wave pipe inspection system
First Claim
1. A system for non-destructive inspection of a structure, comprising:
- at least one magnetostrictive strip configured to be induced with a bias magnetic field and wrapped at least partially around an outer surface of said structure;
a plurality of coil circuits configured to be disposed adjacent to said at least one magnetostrictive strip;
a jacket having at least one component layer configured to be disposed adjacent to at least one of the plurality of coil circuits; and
a tensioner coupled to the jacket and configured to provide a mechanical pressure coupling between said at least one magnetostrictive strip and said structure by tensioning the jacket,wherein said at least one of the plurality of coil circuits is individually controllable by a number of channels to at least one of excite or detect guided waves in said structure.
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Accused Products
Abstract
A system for non-destructive inspection of a structure includes at least one magnetostrictive strip, a plurality of coil circuits, a jacket having at least one component layer, and a tensioner. The at least one magnetostrictive strip is configured to be induced with a bias magnetic field and be wrapped at least partially around an outer surface of the structure. The plurality of coil circuits are configured to be disposed adjacent to the at least one magnetostrictive strip, and the jacket is configured to be disposed adjacent to at least one of the plurality of coil circuits. The tensioner is configured to provide a mechanical pressure coupling between said at least one magnetostrictive strip and said structure. At least one of the plurality of coil circuits is individually controllable by a number of channels to at least one of excite or detect guided waves in said structure.
7 Citations
21 Claims
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1. A system for non-destructive inspection of a structure, comprising:
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at least one magnetostrictive strip configured to be induced with a bias magnetic field and wrapped at least partially around an outer surface of said structure; a plurality of coil circuits configured to be disposed adjacent to said at least one magnetostrictive strip; a jacket having at least one component layer configured to be disposed adjacent to at least one of the plurality of coil circuits; and a tensioner coupled to the jacket and configured to provide a mechanical pressure coupling between said at least one magnetostrictive strip and said structure by tensioning the jacket, wherein said at least one of the plurality of coil circuits is individually controllable by a number of channels to at least one of excite or detect guided waves in said structure. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20)
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21. A system for non-destructive inspection of a structure,
at least one magnetostrictive strip configured to be induced with a bias magnetic field and wrapped at least partially around an outer surface of said structure; -
a plurality of coil circuits configured to be disposed adjacent to said at least one magnetostrictive strip; a jacket having at least one component layer configured to be disposed adjacent to at least one of the plurality of coil circuits; at least one strap configured to be disposed adjacent to said jacket; and a tensioner configured to provide a mechanical pressure coupling between said at least one magnetostrictive strip and said structure, the tensioner configured to straddle said at least wherein the tensioner includes; a drum configured to capture at least one end of said at least one strap and be rotated about an axis, a means for rotating said drum to tension said at least one strap, and a ratchet configured to retain strap tension during tensioning, wherein said at least one of the plurality of coil circuits is individually controllable by a number of channels to at least one of excite or detect guided waves in said structure.
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Specification