Illumination source for an inspection apparatus, inspection apparatus and inspection method
First Claim
1. An illumination source apparatus, suitable for use in a metrology apparatus for characterization of a structure on a substrate, the illumination source apparatus comprising:
- a high harmonic generation, HHG, medium;
a pump radiation source operable to emit a beam of pump radiation; and
adjustable transformation optics configured to adjustably transform a transverse spatial profile of the beam of pump radiation to produce a transformed beam such that relative to a center axis of the transformed beam, a central region of the transformed beam has substantially zero intensity and an outer region which is radially outwards from the center axis of the transformed beam has a non-zero intensity,wherein the transformed beam is arranged to excite the HHG medium so as to generate high harmonic radiation,wherein the location of the outer region is dependent on an adjustment setting of the adjustable transformation optics,wherein the transformed beam is a collimated annular beam having an inner ring radius R1 and an outer ring radius R2 , andwherein the adjustment setting of the adjustable transformation optics is configured to independently tune the inner ring radius R1 and the outer ring radius R2.
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Accused Products
Abstract
An illumination source apparatus (500), suitable for use in a metrology apparatus for the characterization of a structure on a substrate, the illumination source apparatus comprising: a high harmonic generation, HHG, medium (502); a pump radiation source (506) operable to emit a beam of pump radiation (508); and adjustable transformation optics (510) configured to adjustably transform the transverse spatial profile of the beam of pump radiation to produce a transformed beam (518) such that relative to the centre axis of the transformed beam, a central region of the transformed beam has substantially zero intensity and an outer region which is radially outwards from the centre axis of the transformed beam has a non-zero intensity, wherein the transformed beam is arranged to excite the HHG medium so as to generate high harmonic radiation (540), wherein the location of said outer region is dependent on an adjustment setting of the adjustable transformation optics.
33 Citations
20 Claims
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1. An illumination source apparatus, suitable for use in a metrology apparatus for characterization of a structure on a substrate, the illumination source apparatus comprising:
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a high harmonic generation, HHG, medium; a pump radiation source operable to emit a beam of pump radiation; and adjustable transformation optics configured to adjustably transform a transverse spatial profile of the beam of pump radiation to produce a transformed beam such that relative to a center axis of the transformed beam, a central region of the transformed beam has substantially zero intensity and an outer region which is radially outwards from the center axis of the transformed beam has a non-zero intensity, wherein the transformed beam is arranged to excite the HHG medium so as to generate high harmonic radiation, wherein the location of the outer region is dependent on an adjustment setting of the adjustable transformation optics, wherein the transformed beam is a collimated annular beam having an inner ring radius R1 and an outer ring radius R2 , and wherein the adjustment setting of the adjustable transformation optics is configured to independently tune the inner ring radius R1 and the outer ring radius R2. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A method of operating an illumination source apparatus, suitable for use in a metrology apparatus for the characterization of a structure on a substrate, the method comprising:
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providing a high harmonic generation, HHG, medium; operating a pump radiation source to emit a beam of pump radiation; and transforming, by adjustable transformation optics, a transverse spatial profile of the beam of pump radiation to produce a transformed beam such that relative to a center axis of the transformed beam, a central region of the transformed beam has substantially zero intensity and an outer region which is radially outwards from the center axis of the transformed beam has a non-zero intensity, wherein the transformed beam excites the HHG medium so as to generate high harmonic radiation, wherein the location of the outer region is dependent on an adjustment setting of the adjustable transformation optics, wherein the transformed beam is a collimated annular beam having an inner ring radius R1 and an outer ring radius R2, and wherein the inner ring radius R1 and the outer ring radius R2 are independently tuned by the adjustment setting of the adjustable transformation optics.
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14. A lithographic apparatus comprising:
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an illumination source apparatus, suitable for use in a metrology apparatus for characterization of a structure on a substrate, the illumination source apparatus comprising; a high harmonic generation, HHG, medium; a pump radiation source operable to emit a beam of pump radiation; and adjustable transformation optics configured to adjustably transform a transverse spatial profile of the beam of pump radiation to produce a transformed beam such that relative to a center axis of the transformed beam, a central region of the transformed beam has substantially zero intensity and an outer region which is radially outwards from the center axis of the transformed beam has a non-zero intensity, wherein the transformed beam is arranged to excite the HHG medium so as to generate high harmonic radiation, wherein the location of the outer region is dependent on an adjustment setting of the adjustable transformation optics, wherein the transformed beam is a collimated annular beam having an inner ring radius R1 and an outer ring radius R2,and wherein the adjustment setting of the adjustable transformation optics is configured to independently tune the inner ring radius R1 and the outer ring radius R2.
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15. A metrology apparatus comprising:
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an illumination source apparatus, suitable for use in a metrology apparatus for characterization of a structure on a substrate, the illumination source apparatus comprising; a high harmonic generation, HHG, medium; a pump radiation source operable to emit a beam of pump radiation; adjustable transformation optics configured to adjustably transform a transverse spatial profile of the beam of pump radiation to produce a transformed beam such that relative to a center axis of the transformed beam, a central region of the transformed beam has substantially zero intensity and an outer region which is radially outwards from the center axis of the transformed beam has a non-zero intensity; and an output aperture positioned after the HHG medium and aligned with a center axis of generated high harmonic radiation from the HHG medium, the output aperture configured to suppress a residual transformed beam remaining after high harmonic generation and substantially transmit the generated high harmonic radiation, wherein the transformed beam is arranged to excite the HHG medium so as to generate high harmonic radiation, wherein the location of the outer region is dependent on an adjustment setting of the adjustable transformation optics. - View Dependent Claims (16, 17, 18, 19, 20)
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Specification