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Apparatus and methods for protection against inadvertent programming of fuse cells

  • US 10,643,727 B2
  • Filed: 06/12/2019
  • Issued: 05/05/2020
  • Est. Priority Date: 11/02/2016
  • Status: Active Grant
First Claim
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1. A fuse system for a semiconductor die, the fuse system comprising:

  • a fuse protection diode;

    a first fuse;

    a first fuse programming transistor and a first cascode transistor electrically connected in series between a cathode of the fuse protection diode and the first fuse;

    a power supply pad electrically connected to an anode of the fuse protection diode, the power supply pad configured to receive a power supply voltage; and

    a biasing circuit powered by the power supply voltage and including a voltage regulator configured to generate a regulated voltage and a level shifter configured to provide a fuse programming signal to a gate of the first fuse programming transistor, the level shifter configured to control the fuse programming signal with the power supply voltage in a first state of a control signal, and to control the fuse programming signal with the regulated voltage in a second state of the control signal.

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