In-situ straining epitaxial process
First Claim
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1. A method comprising:
- providing a semiconductor substrate with a gate stack;
forming a recess within a source/drain region of the semiconductor substrate, the recess being adjacent to the gate stack;
performing an epitaxial growth process within the recess to form a straining region; and
forming a first defect within the straining region in-situ with the epitaxial growth process;
forming a second defect within the straining region in-situ with the epitaxial growth process such that both the first defect and the second defect form a symmetrical x-shape that extends to a top surface of the straining region;
tuning a temperature parameter of the epitaxial growth process to set a cross-point of the x-shape at a specific location within the straining region such that there is an equal distance between the cross-point and sidewalls of the straining region on both sides of the cross-point; and
forming a semiconductor layer directly on a top surface of the straining region.
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Abstract
A method includes forming a recess in a semiconductor substrate, the recess being adjacent to a gate stack, performing an epitaxial growth process within the recess to form a straining region, and forming a defect within the straining region in-situ with the epitaxial growth process.
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Citations
20 Claims
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1. A method comprising:
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providing a semiconductor substrate with a gate stack; forming a recess within a source/drain region of the semiconductor substrate, the recess being adjacent to the gate stack; performing an epitaxial growth process within the recess to form a straining region; and forming a first defect within the straining region in-situ with the epitaxial growth process; forming a second defect within the straining region in-situ with the epitaxial growth process such that both the first defect and the second defect form a symmetrical x-shape that extends to a top surface of the straining region; tuning a temperature parameter of the epitaxial growth process to set a cross-point of the x-shape at a specific location within the straining region such that there is an equal distance between the cross-point and sidewalls of the straining region on both sides of the cross-point; and forming a semiconductor layer directly on a top surface of the straining region. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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15. A method comprising:
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forming a recess in a source/drain region of a semiconductor substrate, the recess being adjacent to a gate stack, the gate stack positioned above a channel within the semiconductor substrate; performing an epitaxial growth process within the recess to form a straining region to cause a tensile strain on the channel; forming a defect within the straining region in-situ with the epitaxial growth process, the defect comprising at least two dislocations that form an x-shape extending to a top surface of the straining region, the x-shape having a cross-point within the straining region; tuning a pressure parameter of the epitaxial growth process to set a cross-point of the x-shape at a specific location within the straining region such that there is an equal distance between the cross-point and sidewalls of the straining region on both sides of the cross-point; and forming a semiconductor layer directly on the top surface of the straining region. - View Dependent Claims (16, 17)
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18. A method comprising:
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forming a recess within a source/drain region of a semiconductor substrate, the recess being adjacent a gate stack; forming, through an epitaxial process, a straining source/drain region within the recess, the straining source/drain region comprising a cross-point between at least two dislocation defects extending to a top surface of the straining source/drain region; and forming a semiconductor layer directly on the top surface of the straining region; wherein the dislocation defects are formed in-situ with the epitaxial process; wherein to form the dislocation defects, a temperature parameter of the epitaxial growth process is tuned within a range of about 600-800 degrees Celsius and a pressure parameter of the epitaxial growth process is turned within a range of about 0-700 torr to set the cross-point such that there is an equal distance between the cross-point and sidewalls of the straining source/drain region on both sides of the cross-point. - View Dependent Claims (19, 20)
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Specification