Automatic defect classification without sampling and feature selection
First Claim
1. A system for defect classification in a semiconductor process, comprising:
- a communication line configured to receive a defect image of a wafer from the semiconductor process;
a deep architecture neural network in electronic communication with the communication line, comprising;
a first convolution layer of neurons, each neuron configured to convolve a corresponding receptive field of pixels from the defect image with a filter to generate a first feature map;
a first subsampling layer configured to reduce the size and variation of the first feature map; and
a classifier for determining a defect classification based on the feature map; and
wherein the system is configured to inject one or more features learned from local descriptors at one or more higher convolution layers of the deep architecture network, wherein the features learned from local descriptors are determined by;
extracting a plurality of local descriptors at each pixel of each of a plurality of defect images, wherein each of the local descriptors is a defect classifier of the defect images, and wherein each of the local descriptors is external to the deep architecture neural network; and
generating the one or more features learned from local descriptors based on the extracted local descriptors.
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Abstract
Systems and methods for defection classification in a semiconductor process are provided. The system includes a communication line configured to receive a defect image of a wafer from the semiconductor process and a deep-architecture neural network in electronic communication with the communication line. The neural network has a first convolution layer of neurons configured to convolve pixels from the defect image with a filter to generate a first feature map. The neural network also includes a first subsampling layer configured to reduce the size and variation of the first feature map. A classifier is provided for determining a defect classification based on the feature map. The system may include more than one convolution layers and/or subsampling layers. A method includes extracting one or more features from a defect image using a deep-architecture neural network, for example a convolutional neural network.
28 Citations
20 Claims
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1. A system for defect classification in a semiconductor process, comprising:
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a communication line configured to receive a defect image of a wafer from the semiconductor process; a deep architecture neural network in electronic communication with the communication line, comprising; a first convolution layer of neurons, each neuron configured to convolve a corresponding receptive field of pixels from the defect image with a filter to generate a first feature map; a first subsampling layer configured to reduce the size and variation of the first feature map; and a classifier for determining a defect classification based on the feature map; and wherein the system is configured to inject one or more features learned from local descriptors at one or more higher convolution layers of the deep architecture network, wherein the features learned from local descriptors are determined by; extracting a plurality of local descriptors at each pixel of each of a plurality of defect images, wherein each of the local descriptors is a defect classifier of the defect images, and wherein each of the local descriptors is external to the deep architecture neural network; and generating the one or more features learned from local descriptors based on the extracted local descriptors. - View Dependent Claims (2)
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3. A method for defect classification in a semiconductor process, comprising:
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extracting, using a deep-architecture neural network, one or more features from a defect image from the semiconductor process; injecting one or more features learned from local descriptors at one or more higher layers of the deep-architecture neural network, wherein the features learned from local descriptors are determined by; extracting, using a processor, a plurality of local descriptors at each pixel of each of a plurality of defect images, wherein each of the local descriptors is a defect classifier of the defect images, and wherein each of the local descriptors is external to the deep architecture neural network; and generating, using the processor, the one or more features learned from local descriptors based on the extracted local descriptors; and classifying, using the deep-architecture neural network, the defect image based on the extracted one or more features. - View Dependent Claims (4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
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19. A system for deriving features, comprising:
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an electronic storage device; a feature library stored on the storage device; a deep-architecture neural network in electronic communication with the storage device, the neural network having one or more convolutional layers, each convolutional layer of the one or more convolutional layers followed by a subsampling layer, the neural network configured to; derive a feature from one or more defect images of a semiconductor wafer, wherein the feature is for classifying a defect of the defect images; encapsulate the feature with a set of calculations used to determine the feature;
add the encapsulated feature to the feature library of the storage device; andinject one or more features learned from local descriptors at the one or more higher convolution layers, wherein the features learned from local descriptors are determined by; extracting a plurality of local descriptors at each pixel of each of a plurality of defect images, wherein each of the local descriptors is a defect classifier of the defect images, and wherein each of the local descriptors is external to the deep architecture neural network; and generating the one or more features learned from local descriptors based on the extracted local descriptors. - View Dependent Claims (20)
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Specification