Please download the dossier by clicking on the dossier button x
×

Semiconductor device having variable parameter selection based on temperature and test method

  • US 10,656,028 B2
  • Filed: 09/12/2017
  • Issued: 05/19/2020
  • Est. Priority Date: 04/19/2006
  • Status: Active Grant
First Claim
Patent Images

1. An apparatus comprising:

  • a temperature-sensing circuit;

    a first register coupled to and separate from the temperature-sensing circuit and configured to;

    receive a temperature select value from a register load operation; and

    provide the temperature select value to the temperature-sensing circuit; and

    a second register coupled to the temperature-sensing circuit and configured to provide a hysteresis select value to the temperature-sensing circuit.

View all claims
  • 5 Assignments
Timeline View
Assignment View
    ×
    ×