Articulated arm coordinate measuring machine

• US 10,663,274 B2
• Filed: 01/17/2018
• Issued: 05/26/2020
• Est. Priority Date: 01/27/2017
• Status: Active Grant

• Current Assignee: Faro Technologies Incorporated
• Original Assignee: Faro Technologies Incorporated
• Inventors: Creachbaum, John Lucas, Bailey, Brent, Mogensen, Matthew, Schoenfeldt, William E., MacFarlane, Keith G.
• Primary Examiner(s): Fulton, Christopher W
• Application Number:
  US15/873,474
• Publication Number:
  US 20180216923A1
• Time in Patent Office: 860 Days
• Field of Search: 33502, 33503, 33556, 33557, 33558, 33559, 33560, 33561
• CPC Class Codes: G01B 5/008 using coordinate measuring machines
• CPC Class Codes: G01B 5/012 Contact-making feeler heads therefor

Abstract

An articulated arm coordinate measuring machine includes a first end that clamps to a first extension element of a first measurement probe.

Claims

1. A portable articulated arm coordinate measuring machine (AACMM) for measuring the coordinates of an object in space, comprising:

a base;

a manually positionable arm portion having an opposed first end and second end, the arm portion being rotationally coupled to the base, the arm portion including a plurality of connected arm segments, each arm segment including at least one position transducer for producing a position signal;

a first measurement probe coupled to the first end, the first measurement probe having a first extension element;

an electronic circuit that receives the position signal from the at least one position transducer and provides data corresponding to a position of the first measurement probe;

a probe end disposed between the first measurement probe and the first end, the probe end having a clamping mechanism operable to clamp the first extension element onto the probe end at a fixed position; and

a probe latch that when closed clamps the first measurement probe into place and when opened releases the first measurement probe from the probe end.

2. The AACMM of claim 1, wherein the probe latch, when closed, is held in place by an extension magnet.

3. The AACMM of claim 1, wherein the extension element includes a pull stud having a pull-stud notch.

4. The AACMM of claim 3, wherein a pin in the probe end engages the pull-stud notch to clamp the first measurement probe in place.

5. The AACMM of claim 1, wherein the first measurement probe includes first kinematic mechanical elements and the probe end includes second kinematic mechanical elements, the first kinematic mechanical elements being brought into contact with the second kinematic mechanical elements when the first measurement probe is clamped to the probe end, the contact among the first kinematic elements and the second kinematic elements repeatably positioning the first measurement probe to the probe end.

6. The AACMM of claim 5, wherein the first kinematic elements and the second kinematic elements comprise cylinders and balls.

7. The AACMM of claim 5, wherein the first measurement probe further includes first spring loaded pins and the probe end further includes electrical pads, the first spring loaded pins arranged to make electrical contact with the electrical pads when the first measurement probe is clamped to the probe end.

8. The AACMM of claim 5, wherein the first measurement probe is a tactile measurement probe operable to measure three-dimensional (3D) coordinates in response to contacting a probe tip of the tactile measurement probe with points on the object.

9. The AACMM of claim 8, wherein the first measurement probe further comprises a first probe electrical interface, the first probe electrical interface having a first memory into which are stored first numerical compensation parameters for the first measurement probe.

10. The AACMM of claim 9, wherein the first measurement probe retains its accuracy after being detached and reattached, the stored first numerical compensation parameters being used both before detachment and after reattachment.

11. The AACMM of claim 9, further comprising a second measurement probe having a second extension element, second kinematic mechanical elements, and second spring loaded pins, the second measurement probe having a second probe electrical interface having a second memory into which is stored second numerical compensation parameters specific to the second measurement probe.

12. The AACMM of claim 1 wherein the probe end further includes an engagement magnet positioned to engage the first extension element when the first measurement probe is adjacent the first end.

13. The AACMM of claim 12 wherein:

the latch mechanism includes a carrier with an opening on an end, the engagement magnet being disposed in the opening; and

the first extension element engages the engagement magnet when the first extension element is disposed in the opening.