Automated pattern fidelity measurement plan generation
First Claim
1. A system configured to determine one or more parameters of a metrology process to be performed on a specimen, comprising:
- a measurement subsystem comprising at least an energy source and a detector, wherein the energy source is configured to generate energy that is directed to a specimen, and wherein the detector is configured to detect energy from the specimen and to generate output responsive to the detected energy; and
one or more computer subsystems configured for;
automatically generating regions of interest to be measured during a metrology process performed for the specimen with the measurement subsystem based on a design for the specimen;
automatically determining one or more parameters of one or more measurements performed in first and second subsets of the regions of interest during the metrology process with the measurement subsystem based on portions of the design for the specimen located in the first and second subsets of the regions of interest, respectively, wherein the one or more parameters of the one or more measurements performed in the first subset are determined separately and independently of the one or more parameters of the one or more measurements performed in the second subset;
automatically generating one or more attributes for multiple instances of the regions of interest in one of the first and second subsets based on results of the one or more measurements; and
comparing at least one of the one or more attributes for two or more of the multiple instances to identify outliers in the two or more of the multiple instances.
1 Assignment
0 Petitions
Accused Products
Abstract
Methods and systems for determining parameter(s) of a metrology process to be performed on a specimen are provided. One system includes one or more computer subsystems configured for automatically generating regions of interest (ROIs) to be measured during a metrology process performed for the specimen with the measurement subsystem based on a design for the specimen. The computer subsystem(s) are also configured for automatically determining parameter(s) of measurement(s) performed in first and second subsets of the ROIs during the metrology process with the measurement subsystem based on portions of the design for the specimen located in the first and second subsets of the ROIs, respectively. The parameter(s) of the measurement(s) performed in the first subset are determined separately and independently of the parameter(s) of the measurement(s) performed in the second subset.
50 Citations
27 Claims
-
1. A system configured to determine one or more parameters of a metrology process to be performed on a specimen, comprising:
-
a measurement subsystem comprising at least an energy source and a detector, wherein the energy source is configured to generate energy that is directed to a specimen, and wherein the detector is configured to detect energy from the specimen and to generate output responsive to the detected energy; and one or more computer subsystems configured for; automatically generating regions of interest to be measured during a metrology process performed for the specimen with the measurement subsystem based on a design for the specimen; automatically determining one or more parameters of one or more measurements performed in first and second subsets of the regions of interest during the metrology process with the measurement subsystem based on portions of the design for the specimen located in the first and second subsets of the regions of interest, respectively, wherein the one or more parameters of the one or more measurements performed in the first subset are determined separately and independently of the one or more parameters of the one or more measurements performed in the second subset; automatically generating one or more attributes for multiple instances of the regions of interest in one of the first and second subsets based on results of the one or more measurements; and comparing at least one of the one or more attributes for two or more of the multiple instances to identify outliers in the two or more of the multiple instances. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25)
-
-
26. A non-transitory computer-readable medium, storing program instructions executable on a computer system for performing a computer-implemented method for determining one or more parameters of a metrology process to be performed on a specimen, wherein the computer-implemented method comprises:
-
automatically generating regions of interest to be measured during a metrology process performed for a specimen with a measurement subsystem based on a design for the specimen, wherein the measurement subsystem comprises at least an energy source and a detector, wherein the energy source is configured to generate energy that is directed to the specimen, and wherein the detector is configured to detect energy from the specimen and to generate output responsive to the detected energy; automatically determining one or more parameters of one or more measurements performed in first and second subsets of the regions of interest during the metrology process with the measurement subsystem based on portions of the design for the specimen located in the first and second subsets of the regions of interest, respectively, wherein the one or more parameters of the one or more measurements performed in the first subset are determined separately and independently of the one or more parameters of the one or more measurements performed in the second subset; automatically generating one or more attributes for multiple instances of the regions of interest in one of the first and second subsets based on results of the one or more measurements; and comparing at least one of the one or more attributes for two or more of the multiple instances to identify outliers in the two or more of the multiple instances.
-
-
27. A computer-implemented method for determining one or more parameters of a metrology process to be performed on a specimen, comprising:
-
automatically generating regions of interest to be measured during a metrology process performed for a specimen with a measurement subsystem based on a design for the specimen, Wherein the measurement subsystem comprises at least an energy source and a detector, wherein the energy source is configured to generate energy that is directed to the specimen, and Wherein the detector is configured to detect energy from the specimen and to generate output responsive to the detected energy; automatically determining one or more parameters of one or more measurements performed in first and second subsets of the regions of interest during the metrology process with the measurement subsystem based on portions of the design for the specimen located in the first and second subsets of the regions of interest, respectively, wherein the one or more parameters of the one or more measurements performed in the first subset are determined separately and independently of the One or more parameters of the one or more measurements performed in the second subset, and wherein said automatically generating and said automatically determining are performed by one or more computer systems; automatically generating One or more attributes for multiple instances of the regions of interest in one of the first and second subsets based on results of the one or more measurements; and comparing at least one of the one or more attributes for two or more of the multiple instances to identify outliers in the two or more of the multiple instances.
-
Specification