Method of measurement on a machine tool
First Claim
1. A method of scanning an object using a contact analogue probe comprising a deflectable stylus for contacting the object mounted on a machine tool, so as to collect scanned measurement data along a nominal measurement line on the surface of the object, the analogue probe having a preferred measurement range, the method comprising:
- controlling the contact analogue probe and/or object to perform a scanning operation in accordance with a predetermined course of relative motion, the predetermined course of relative motion being configured such that the contact analogue probe'"'"'s preferred measuring range traverses across the object along the nominal measurement line a plurality of times, in which the position of the contact analogue probe'"'"'s preferred measuring range relative to the surface of the object is different for different traverses, andfiltering the data obtained by the contact analogue probe so as to obtain select scanned measurement data, relating to scanned measurement data obtained predominantly from either within or outside the contact analogue probe'"'"'s preferred measurement range.
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Accused Products
Abstract
A method of scanning an object using an analogue probe mounted on a machine tool, so as to collect scanned measurement data along a nominal measurement line on the surface of the object, the analogue probe having a preferred measurement range. The method includes controlling the analogue probe and/or object to perform a scanning operation in accordance with a course of relative motion, the course of relative motion being configured such that, based on assumed properties of the surface of the object, the analogue probe will be caused to obtain data within its preferred measuring range, as well as cause the analogue probe to go outside its preferred measuring range, along the nominal measurement line on the surface of the object.
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Citations
26 Claims
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1. A method of scanning an object using a contact analogue probe comprising a deflectable stylus for contacting the object mounted on a machine tool, so as to collect scanned measurement data along a nominal measurement line on the surface of the object, the analogue probe having a preferred measurement range, the method comprising:
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controlling the contact analogue probe and/or object to perform a scanning operation in accordance with a predetermined course of relative motion, the predetermined course of relative motion being configured such that the contact analogue probe'"'"'s preferred measuring range traverses across the object along the nominal measurement line a plurality of times, in which the position of the contact analogue probe'"'"'s preferred measuring range relative to the surface of the object is different for different traverses, and filtering the data obtained by the contact analogue probe so as to obtain select scanned measurement data, relating to scanned measurement data obtained predominantly from either within or outside the contact analogue probe'"'"'s preferred measurement range. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22)
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- 23. A machine tool apparatus comprising a machine tool, a contact analogue probe having a deflectable stylus mounted on the machine tool, and a controller configured to control the relative movement of the contact analogue probe and an object to be measured so as to so as to collect scanned measurement data along a nominal measurement line on the surface of the object, and in particular so as to control the contact analogue probe and/or object in accordance with a predetermined course of relative motion such that the contact analogue probe'"'"'s preferred measuring range will traverse across the object along the nominal measurement line a plurality of times, in which the position of the contact analogue probe'"'"'s preferred measuring range relative to the surface of the object is different for different traverses, the machine tool apparatus further configured to filter the data obtained by the contact analogue probe so as to obtain data relating to scanned measurement data obtained predominantly from either within or outside the contact analogue probe'"'"'s preferred measurement range.
Specification