Holdup self-tests for power loss operations on memory systems
First Claim
1. A system comprising:
- a holdup circuit to provide holdup energy to the system for a set of power loss operations by the system;
a memory component operatively coupled with the holdup circuit; and
a processing device, operatively coupled with the memory component and the holdup circuit, to;
receive a first request to perform a holdup self-test in a self-test mode of the system;
identify a memory location of the memory component that is available to write self-test data during the self-test mode responsive to the first request;
detect a loss of power to the system while in the self-test mode;
responsive to detection of the loss of power, perform a continuous sequence of write operations to write the self-test data to the memory location using the holdup energy from the holdup circuit until an amount of holdup energy is expended;
after reboot of the system, determine a number of write operations successfully completed in the memory location by the continuous sequence of write operations before the amount of holdup energy is expended;
determine whether the number of write operations successfully completed satisfies a defect criterion; and
responsive to the number of write operations successfully completed satisfying the defect criterion, report a defect associated with the holdup circuit.
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Accused Products
Abstract
Described herein are embodiments related to holdup self-tests in memory sub-systems for power loss operations. A processing device receives a request to perform a holdup self-test to detect a defect in a holdup circuit that powers the processing device and a memory component in the event of power loss. The processing device identifies a memory location of memory that is available and, responsive to detection of a loss of power, performs a continuous sequence of write operations to the memory location using holdup energy until all of the holdup energy is expended. After reboot, the processing device determines a number of the write operations that were successfully completed in the memory location before all of the holdup energy was expended. The processing device determines whether the number satisfies a defect criterion. Responsive to the responsive to the number satisfying the defect criterion, the processing device reports the defect associated with the holdup circuit.
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Citations
20 Claims
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1. A system comprising:
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a holdup circuit to provide holdup energy to the system for a set of power loss operations by the system; a memory component operatively coupled with the holdup circuit; and a processing device, operatively coupled with the memory component and the holdup circuit, to; receive a first request to perform a holdup self-test in a self-test mode of the system; identify a memory location of the memory component that is available to write self-test data during the self-test mode responsive to the first request; detect a loss of power to the system while in the self-test mode; responsive to detection of the loss of power, perform a continuous sequence of write operations to write the self-test data to the memory location using the holdup energy from the holdup circuit until an amount of holdup energy is expended; after reboot of the system, determine a number of write operations successfully completed in the memory location by the continuous sequence of write operations before the amount of holdup energy is expended; determine whether the number of write operations successfully completed satisfies a defect criterion; and responsive to the number of write operations successfully completed satisfying the defect criterion, report a defect associated with the holdup circuit. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. A storage system comprising:
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a power manager circuit to supply power from an external power source or a secondary power source; a plurality of memory components coupled to the power manager circuit; and a controller coupled to the power manager circuit and the plurality of memory components, wherein the controller, in response to a request, is to; identify a set of available blocks in the plurality of memory components, wherein the set of available blocks comprises an available block in each of the plurality of memory components; detect a power loss condition in which power from the external power source is lost; responsive to detection of the power loss condition, continuously write test data in the set of available blocks in a specified pattern until an amount of power from the secondary power source is expended by supplying power to the controller and the plurality of memory components during the power loss condition; responsive to restoration of the power from the external power source, read written data results from the set of available blocks and determine whether the secondary power source has a defect using at least the written data results; and responsive to detection of the defect, report the defect of the secondary power source. - View Dependent Claims (15, 16)
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17. A method comprising:
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receiving, by a controller, a request to transition to a holdup self-test mode to check for a defect in a secondary power source of a memory system comprising the controller and a plurality of memory components; responsive to the request, identifying a set of available memory locations in the plurality of memory components; detecting a power loss condition of the memory system in which power supplied by a primary power source to the memory system is removed; responsive to detection of the power loss condition, supplying power to the memory system via a secondary power source; responsive to detection of the power loss condition, writing a specified pattern of test data in the set of available memory locations until an amount of power from the secondary power source is expended; responsive to restoration of the power to the memory system by the primary power source, determining whether the secondary power source has a defect using results of the specified pattern of test data written in the set of available memory locations before the amount of power from the secondary power is expended; and reporting that the secondary power source has the defect responsive to a determination that the secondary power source has the defect. - View Dependent Claims (18, 19, 20)
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Specification