Apparatus for overload recovery of an integrator in a sigma-delta modulator

• US 10,680,637 B2
• Filed: 02/08/2019
• Issued: 06/09/2020
• Est. Priority Date: 06/25/2015
• Status: Active Grant

• Current Assignee: Apple Inc.
• Original Assignee: Apple Inc.
• Inventors: Kauffman, John G., Dufrene, Krzysztof
• Primary Examiner(s): Lauture, Joseph J
• Application Number:
  US16/271,727
• Publication Number:
  US 20190173485A1
• Time in Patent Office: 487 Days
• Field of Search: 341118, 341155, 341120, 341143
• CPC Class Codes: H03M 1/00 Analogue/digital conversion; Digital/analogue conversion conversion of analogue values to or from differential modulation H03M3/00
• CPC Class Codes: H03M 1/06 Continuously compensating for, or preventing, undesired influence of physical parameters periodically, e.g. by using stored correction values, H03M1/10
• CPC Class Codes: H03M 1/0607 Offset or drift compensation removal of offset already present on the analogue input signal H03M1/1295
• CPC Class Codes: H03M 1/10 Calibration or testing
• CPC Class Codes: H03M 1/12 Analogue/digital converters H03M1/001 – H03M1/10 take precedence
• CPC Class Codes: H03M 1/46 with digital/analogue converter for supplying reference values to converter
• CPC Class Codes: H03M 3/30 Delta-sigma modulation
• CPC Class Codes: H03M 3/356 Offset or drift compensation removal of offset already present on the analogue input signal H03M3/494
• CPC Class Codes: H03M 3/386 over the full range of the converter, e.g. for correcting differential non-linearity
• CPC Class Codes: H03M 3/424 the quantiser being a multiple bit one
• CPC Class Codes: H03M 3/444 using non-linear elements, e.g. limiters
• CPC Class Codes: H03M 3/454 with distributed feedback, i.e. with feedback paths from the quantiser output to more than one filter stage
• CPC Class Codes: H03M 3/464 Details of the digital/analogue conversion in the feedback path

Abstract

Described is an apparatus which comprises: a first integrator to receive an input signal and to generate a first output; a second integrator to receive the first output or a version of the first output and to generate a second output; and an analog-to-digital converter (ADC) to quantize the second output into a digital representation, the ADC including a detection circuit to detect an overload condition in the second output.

Claims

1. An apparatus comprising:

a bias generator including an amplifier coupled to a transistor which is controllable by a signal which indicates an overload in an output of an integrator; and

a digital-to-analog converter (DAC) coupled to the bias generator, wherein the DAC is to increase its current when the transistor is turned on by the signal which indicates the overload.

2. The apparatus of claim 1, wherein the DAC comprises a p-type transistor to receive a first bias from the bias generator, and an n-type transistor to receive a second bias from the bias generator.

3. The apparatus of claim 2, wherein the p-type transistor and the n-type transistor is to increase current through the p-type transistor and the n-type transistor when the transistor of the bias generator is turned on by the signal which indicates the overload.

4. The apparatus of claim 2, wherein the DAC comprises a first digitally switchable transistor coupled to the p-type transistor;

and a second digitally switchable transistor coupled to the n-type transistor and also coupled in series with the first digitally switchable transistor.

5. The apparatus of claim 1, wherein the amplifier of the bias generator is to receive a common mode voltage of an analog-to-digital (ADC) converter.

6. The apparatus of claim 5, wherein an output of the amplifier is coupled to a first p-type transistor of the bias generator.

7. The apparatus of claim 6, wherein a drain terminal of the first p-type transistor is coupled to an input of the amplifier.

8. The apparatus of claim 7, wherein the bias generator comprises:

a first resistive device coupled in series with the first p-type transistor, wherein the first resistive device is coupled to the input of the amplifier; and

a second resistive device coupled to the first resistive device and to the transistor controllable by the signal which indicates the overload.

9. The apparatus of claim 8, wherein the transistor controllable by the signal is an n-type transistor.

10. An apparatus comprising:

an integrator;

an analog-to-digital converter (ADC) coupled to the integrator, wherein the ADC is to detect an overload condition in an output of the integrator, wherein the output of the integrator is an input of the ADC;

a bias generator including an amplifier coupled to a transistor which is controllable by a signal which indicates the overload condition; and

a digital-to-analog converter (DAC) coupled to the bias generator, wherein the DAC is to increase its current when the transistor of the bias generator is turned on by the overload condition.

11. The apparatus of claim 10, wherein the DAC comprises a p-type transistor to receive a first bias from the bias generator, and an n-type transistor to receive a second bias from the bias generator.

12. The apparatus of claim 11, wherein the p-type transistor and the n-type transistor is to increase current through the p-type transistor and the n-type transistor when the transistor of the bias generator is turned on by the overload condition.

13. The apparatus of claim 12, wherein the DAC comprises a first digitally switchable transistor coupled to the p-type transistor;

and a second digitally switchable transistor coupled to the n-type transistor and also coupled in series with the first digitally switchable transistor.

14. The apparatus of claim 10, wherein the overload condition is detected when the output of the integrator reaches a voltage of a power supply voltage level from a power supply rail, wherein the power supply rail is coupled to the integrator.

15. An apparatus comprising:

an antenna;

an integrated circuit (IC) coupled to the antenna, the IC including a sigma-delta modulator comprising;

a loop filter including an integrator;

an analog-to-digital converter (ADC) to quantize an output of the loop filter into a digital representation, the ADC including a detection circuit which is to detect an overload condition in the output of the loop filter; and

a digital-to-analog converter (DAC) coupled to the output of the ADC and an input of the loop filter, wherein the DAC is to increase its current to the loop filter when the overload condition is detected; and

a processor coupled to the IC.

16. The apparatus of claim 15, further comprising a bias generator including an amplifier coupled to a transistor which is controllable by a signal which indicates the overload condition.

17. The apparatus of claim 15, wherein the ADC is to detect the overload condition when the output of the loop filter reaches a voltage of a power supply voltage level from a power supply rail, and wherein the power supply rail is coupled to the loop filter.

18. The apparatus of claim 15, further comprising a low pass filter coupled to an input of the loop filter.

19. The apparatus of claim 18 further comprising a mixer coupled to the low pass filter.

20. The apparatus of claim 19 further comprising a low noise amplifier (LNA) coupled to the mixer and the antenna.