Contact head for an electrical testing device, testing device
First Claim
1. A contact head for an electrical test device for electrically testing substrates, the contact head comprising:
- at least a first guide plate and a second guide plate arranged relative to each other by a spacer, the first guide plate including a first plurality of guide openings, the second guide plate including a second plurality of guide openings essentially aligned with the first plurality of guide openings;
a plurality of pin-shaped contact elements each received by a first corresponding guide opening of the first plurality of guide openings and a second corresponding guide opening of the second plurality of guide openings; and
a centering device for orienting the first and second guide plates relative to one another, the centering device defining four slots and including four centering pins, each of the four slots extending toward a center of the contact head, in at least of one of the guide plates, and receiving a corresponding centering pin of the four centering pins, each of the four centering pins held in a corresponding centering opening of the spacer, the centering openings each having only one guide surface oriented at least essentially parallel to a radial axis of the center of the contact head.
1 Assignment
0 Petitions
Accused Products
Abstract
A contact head (6) for an electrical test device (1) for electrically testing substrates, which have electrical contact points, with at least two guide plates (13, 14) that are arranged to each other by a spacer (15) and each have guide openings (16) essentially aligned with each other for receiving pin-shaped contact elements (8) and are oriented to each other by a centering device (20), wherein the centering device (20) has four centering pins (19), which are displaceably mounted in a slot (23), extending toward a center (Z) of the contact head (6), at least of one of the guide plates (13, 14), and wherein the centering pins (19) are each held in a centering opening (18) of the spacer (15). It is provided that the centering openings (18) each have only one guide surface (21) oriented at least essentially parallel to a radial axis (R)—in relation to the center (Z).
7 Citations
10 Claims
-
1. A contact head for an electrical test device for electrically testing substrates, the contact head comprising:
-
at least a first guide plate and a second guide plate arranged relative to each other by a spacer, the first guide plate including a first plurality of guide openings, the second guide plate including a second plurality of guide openings essentially aligned with the first plurality of guide openings; a plurality of pin-shaped contact elements each received by a first corresponding guide opening of the first plurality of guide openings and a second corresponding guide opening of the second plurality of guide openings; and a centering device for orienting the first and second guide plates relative to one another, the centering device defining four slots and including four centering pins, each of the four slots extending toward a center of the contact head, in at least of one of the guide plates, and receiving a corresponding centering pin of the four centering pins, each of the four centering pins held in a corresponding centering opening of the spacer, the centering openings each having only one guide surface oriented at least essentially parallel to a radial axis of the center of the contact head. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
-
Specification
-
- Resources
-
Current AssigneeFeinmetall GmbH
-
Original AssigneeFeinmetall GmbH
-
InventorsTreuz, Stefan, Tabakow, Denis, Kopilas, Berislav
-
Primary Examiner(s)Astacio-Oquendo, Giovanni
-
Application NumberUS15/992,915Publication NumberTime in Patent Office748 DaysField of Search32475501, 324537, 324500US Class CurrentCPC Class CodesG01R 1/06738 related to tip portionG01R 1/44 Modifications of instrument...G01R 31/2831 Testing of materials or sem...G01R 31/2886 Features relating to contac...
