Method and apparatus to correct for patterning process error
First Claim
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1. A method comprising:
- modelling, by a hardware computer system, high resolution patterning error information of a patterning process involving a patterning device in a patterning system using an error mathematical model;
modelling, by the computer system, a correction of the patterning error that can be made by a patterning device modification tool using a correction mathematical model, the correction mathematical model having substantially the same resolution as the error mathematical model;
determining, by the computer system, modification information for modifying the patterning device using the patterning device modification tool by applying the correction mathematical model to the patterning error information modeled by the error mathematical model, wherein modification of the patterning device using the patterning device modification tool comprises alteration of a property of a substrate of the patterning device with a radiation beam generated by the patterning device modification tool; and
outputting an electronic or optical signal representing the modification information, or representing data derived from the modification information, toward at least part of the patterning device modification tool for modifying the patterning device.
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Abstract
A method including modeling high resolution patterning error information of a patterning process involving a patterning device in a patterning system using an error mathematical model, modeling a correction of the patterning error that can be made by a patterning device modification tool using a correction mathematical model, the correction mathematical model having substantially the same resolution as the error mathematical model, and determining modification information for modifying the patterning device using the patterning device modification tool by applying the correction mathematical model to the patterning error information modeled by the error mathematical model.
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Citations
20 Claims
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1. A method comprising:
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modelling, by a hardware computer system, high resolution patterning error information of a patterning process involving a patterning device in a patterning system using an error mathematical model; modelling, by the computer system, a correction of the patterning error that can be made by a patterning device modification tool using a correction mathematical model, the correction mathematical model having substantially the same resolution as the error mathematical model; determining, by the computer system, modification information for modifying the patterning device using the patterning device modification tool by applying the correction mathematical model to the patterning error information modeled by the error mathematical model, wherein modification of the patterning device using the patterning device modification tool comprises alteration of a property of a substrate of the patterning device with a radiation beam generated by the patterning device modification tool; and outputting an electronic or optical signal representing the modification information, or representing data derived from the modification information, toward at least part of the patterning device modification tool for modifying the patterning device. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A system comprising:
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a hardware processor system; and a non-transitory computer readable storage medium storing machine-readable instructions, the machine-readable instructions, upon execution by the processor system, configured to cause the processor system to at least; model high resolution patterning error information of a patterning process involving a patterning device in a patterning system using an error mathematical model; model a correction of the patterning error that can be made by a patterning device modification tool using a correction mathematical model, the correction mathematical model having substantially the same resolution as the error mathematical model; determine modification information for modifying the patterning device using the patterning device modification tool by applying the correction mathematical model to the patterning error information modeled by the error mathematical model, wherein modification of the patterning device using the patterning device modification tool comprises alteration of a property of a substrate of the patterning device with a radiation beam generated by the patterning device modification tool; and output an electronic or optical signal representing the modification information, or representing data derived from the modification information, toward the patterning modification tool for modifying the patterning device. - View Dependent Claims (8, 9, 10, 11, 12, 13)
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14. A non-transitory computer program product comprising machine-readable instructions stored therein, the instructions, upon execution by a processor system, configured to cause the processor system to at least:
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model high resolution patterning error information of a patterning process involving a patterning device in a patterning system using an error mathematical model; model a correction of the patterning error that can be made by a patterning device modification tool using a correction mathematical model, the correction mathematical model having substantially the same resolution as the error mathematical model; determine modification information for modifying the patterning device using the patterning device modification tool by applying the correction mathematical model to the patterning error information modeled by the error mathematical model, wherein modification of the patterning device using the patterning device modification tool comprises alteration of a property of a substrate of the patterning device with a radiation beam generated by the patterning device modification tool; and output an electronic or optical signal representing the modification information, or representing data derived from the modification information, toward the patterning modification tool for modifying the patterning device. - View Dependent Claims (15, 16, 17, 18, 19, 20)
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Specification