Metrology method, computer product and system
First Claim
1. A method comprising:
- determining an asymmetric deformation of a physical target using a measured parameter of radiation diffracted by the target; and
determining, by a hardware computer system and based on the asymmetric deformation, a property of a measurement beam to optically measure the target or another target that is least sensitive to change in a target formation parameter associated with the target or the other target,where the property, or information derived from the property, is configured to setup or modify a measurement apparatus to measure the target or other target with a measurement beam according to the property.
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Accused Products
Abstract
A method including determining a type of structural asymmetry of the target from measured values of the target, and performing a simulation of optical measurement of the target to determine a value of an asymmetry parameter associated with the asymmetry type. A method including performing a simulation of optical measurement of a target to determine a value of an asymmetry parameter associated with a type of structural asymmetry of the target determined from measured values of the target, and analyzing a sensitivity of the asymmetry parameter to change in a target formation parameter associated with the target. A method including determining a structural asymmetry parameter of a target using a measured parameter of radiation diffracted by the target, and determining a property of a measurement beam of the target based on the structural asymmetry parameter that is least sensitive to change in a target formation parameter associated with the target.
21 Citations
35 Claims
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1. A method comprising:
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determining an asymmetric deformation of a physical target using a measured parameter of radiation diffracted by the target; and determining, by a hardware computer system and based on the asymmetric deformation, a property of a measurement beam to optically measure the target or another target that is least sensitive to change in a target formation parameter associated with the target or the other target, where the property, or information derived from the property, is configured to setup or modify a measurement apparatus to measure the target or other target with a measurement beam according to the property. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method comprising:
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determining an asymmetric deformation of a target from measured values of the target; and performing a computer simulation of optical measurement of the target to determine a value of an asymmetry parameter associated with the determined asymmetric deformation. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23)
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24. A method comprising:
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performing a computer simulation of optical measurement of a target to determine a value of an asymmetry parameter associated with an asymmetric deformation of the target determined from measured values of the target; and analyzing a sensitivity of the asymmetry parameter to change in a target formation parameter associated with the target. - View Dependent Claims (25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35)
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Specification