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SYSTEM AND METHOD FOR DETECTING DEFECTS WITHIN AN ELECTRICAL CIRCUIT BY ANALYZING QUIESCENT CURRENT

  • US 20010011903A1
  • Filed: 12/01/1998
  • Published: 08/09/2001
  • Est. Priority Date: 12/01/1998
  • Status: Active Grant
First Claim
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1. A system for detecting defects within circuits, the system comprising:

  • a circuit;

    a power supply unit, said power supply unit configured to transmit supply current to said circuit;

    a current meter configured to receive said supply current and to transmit a first signal and a second signal respectively indicating a first value and a second value of said supply current; and

    an analyzer configured to receive said first and second signals, to determine a threshold value based on said first signal, to compare said second signal to said threshold value, and to determine whether said circuit is defective based on a comparison of said second signal to said threshold value.

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