Integrated circuit with test interface

• US 20010015653A1
• Filed: 02/22/2001
• Published: 08/23/2001
• Est. Priority Date: 02/23/2000
• Status: Active Grant

• Current Assignee: Koninklijke Philips Electronics N.V. (Koninklijke Philips N.V.)
• Original Assignee: US Philips Corporation (Koninklijke Philips N.V.)
• Inventors: Kup, Bernardus Martinus Johannes, Den Besten, Gerrit Willem, Schuttert, Rodger Frank, De Jong, Franciscus Gerardus Maria, Van Uden, Albertus Jan Paulus Maria, De Wilde, Johannes
• Granted Patent: US 6,664,798 B2
• Time in Patent Office: Days
• US Class Current: 324/763
• CPC Class Codes: G01R 31/2853 Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections G01R31/31717 takes precedence; test of chip-to-PCB or lead-to-PCB connections G01R31/66

Abstract

Integrated circuit with a test interface for testing a conductive connection between a supply pad and a supply of a functional block in the integrated circuit. A current test circuit has test inputs coupled to a first and a second point along the conductive connection, for comparing a voltage across the test inputs with a threshold. The current test circuit contains a threshold shifting circuit for shifting the threshold to a shifted value dependent on a voltage across the test inputs when the threshold shifting circuit is active. Testing is executed in two steps, making the threshold shifting circuit active when a first voltage is applied across test inputs and comparing a second voltage at the test input with the shifted threshold. One of the first and second voltage is a voltage drop across the connection when the integrated circuit is set to draw current along said connection, the other one of the first and second voltage is a reference voltage. In an embodiment the integrated circuit has a shunt circuit to provoke current through the conductive connection under test in parallel with current through the functional block.

Claims

1. Integrated circuit with a test interface, the integrated circuit comprising

a supply pad;

a functional block with a supply input;

a conductive connection between the supply pad and the supply input;

a current test circuit having test inputs coupled to a first and a second point along the conductive connection, for comparing a voltage across the test inputs with a threshold, the current test circuit comprising a threshold shifting circuit for shifting the threshold to a shifted value dependent on a voltage across the test inputs when the threshold shifting circuit is active;

wherein the test interface is connected to the threshold shifting circuit and the current test circuit, and the test interface provides for execution of a test command, the execution comprising at least the steps of making the threshold shifting circuit active when a first voltage is applied across test inputs and comparing a second voltage at the test input with the shifted threshold, one of the first and second voltage being a voltage drop across the connection when the integrated circuit is set to draw current along said connection, the other one of the first and second voltage being a reference voltage.

2. Integrated circuit according to

claim 1

, comprising a switch for switching the integrated circuit, the threshold shifting circuit, when active, shifting the threshold to a level equal the voltage across the test inputs, and subsequently by a predetermined amount at least during said comparing.

3. Integrated circuit according to

claim 2

, the test interface being arranged to select the predetermined amount.

4. Integrated circuit according to

claim 1

comprising a timer for generating a relative timing of said shifting and comparing steps.

5. Integrated circuit according to

claim 1

, comprising a switch network, for connecting the test inputs to a common node when the reference voltage is applied.

6. Integrated circuit according to

claim 5

, the switch network comprising a first, second, third and fourth transistor, a first one of the test inputs being coupled to the first point and to the common node via a main current channel of the first and second transistor respectively, a second one of the test inputs being coupled to the second point and the common node via a main current channel of the third and fourth transistor respectively, control electrodes of the second and fourth transistor being activated when the test inputs are connected to the common node, control electrodes of the first and third transistor being activated when the voltage drop is applied to the test inputs.

7. Integrated circuit according to

claim 6

, the current test circuit comprising

a node;

a first, second and third current supply circuit each with a current output coupled to the node, the first current supply circuit having a current control input coupled to the power supply connection;

a comparator having an input coupled to the node and an output coupled to a test result output of the integrated circuit;

a switch coupled between the node and a control input of the second current supply input;

a control circuit arranged to make the switch conductive, whereby said threshold is shifted, to make the switch non-conductive during said comparing and to cause the third current supply circuit to change a current supplied to the node after making the switch nonconductive and before determining a detection result, whereby the threshold is offset by a predetermined amount from a level reached during shifting.

8. Integrated circuit according to

claim 1

comprising a scan chain for entering test commands and reading test results, the scan chain being coupled to the threshold shifting circuit and the current test circuit for, in response to a command to test the supply current successively activating and deactivating the threshold shifting circuit and sampling a result of detection of the current test circuit, the integrated circuit comprising a timing circuit for controlling timing of at least said deactivating autonomously, without requiring a further command from the scan chain.

9. Integrated circuit according to

claim 1

, the test interface being arranged to activate an output buffer of the functional block a predetermined time interval before said comparing or shifting, whichever involves applying said voltage drop to the test inputs, so as to start drawing current along said connection in order to apply the voltage drop to the test inputs.

10. Integrated circuit according to

claim 1

comprising a switchable shunt circuit, a main current path of the shunt circuit being connected in parallel with the functional block so as to draw current from the supply pad via the conductive connection in parallel with the functional block, the test interface being arranged to maintain the shunt circuit in a nonconductive state during normal operation of the integrated circuit and to switch the shunt circuit into a conductive state at least when the integrated circuit is set to draw current along said connection in order to apply the voltage drop to the test inputs.

11. Integrated circuit according to

claim 10

, comprising a power supply conductor, the supply pad being one of a set of supply pads for a same power supply voltage, each coupled to the power supply conductor via a respective testable conductive connection, the shunt circuit being one of a set of shunt circuits, each connected to the power supply conductor electrically closest to a respective one of the conductive connections, the test interface being arranged to test each of the conductive connections by making that shunt circuit conduct that is connected to the power supply conductor electrically closest to a conductive connection under test, at least at a time when the integrated circuit is set to draw current along the conductive connection under test, the test interface being arranged to keep non-conductive at said time at least one of the set of shunt circuits that is connected to the power supply conductor electrically further away from the conductive connection under test than the electrically closest shunt circuit.

12. Integrated circuit according to

claim 11

, the test interface being arranged to make conductive at said time a subset of at least two shunt circuits that are all electrically closer to the conductive connection under test than any other one of the conductive connections, and to make non-conductive at said time the remaining ones of the set of shunt circuits.

13. Integrated circuit according to

claim 12

, comprising

a further current test circuit connected to a one of the conductive connections other than the conductive connection under test, the one of the conductive connections being connected to the power supply conductor electrically closer to one of the at least two shunt circuits than any one of the remaining ones of the shunt circuits, the further current test circuit being self testable, the test interface being arranged to cause a self test of the further current test when the at least two shunt circuits are made conductive.

14. Method of testing an integrated circuit, wherein the integrated circuit comprises a supply pad, a functional block and a conductive connection between the supply pad and the functional block;

the integrated circuit comprising a current test circuit having test inputs coupled to the conductive connection for comparing a threshold with a voltage drop along said conductive connection due to a supply current from the supply pad to the functional block, the method comprising at least the steps shifting the threshold dependent on a first voltage applied across test inputs and comparing a second voltage at the test input with the shifted threshold, one of the first and second voltage being a voltage drop across the connection when the integrated circuit is set to draw current along said connection, the other one of the first and second voltage being a reference voltage.

15. Method according to

claim 14

wherein said voltage drop is induced by switching on an output buffer a predetermined time interval before said shifting or comparing, whichever involves applying said voltage drop to the test inputs.