Particle signal processing apparatus and particle measurement apparatus using same

• US 20010032495A1
• Filed: 03/22/2001
• Published: 10/25/2001
• Est. Priority Date: 04/21/2000
• Status: Active Grant

• Current Assignee: Sysmex Corporation
• Original Assignee: Sysmex Corporation
• Inventors: Shinabe, Seiya, Ueno, Kunio, Nakamura, Yoichi
• Granted Patent: US 6,534,965 B2
• Time in Patent Office: Days
• US Class Current: 73/61.71
• CPC Class Codes: G01N 15/132 Circuits
• CPC Class Codes: G01N 2015/1019 Associating Coulter-counter and optical flow cytometer [OFC]
• CPC Class Codes: G01N 2015/1024 Counting particles by non-optical means
• CPC Class Codes: G01N 2015/1028 Sorting particles

Abstract

A particle signal processing apparatus which processes a particle signal representative of characteristics of particles includes an amplifier having input and output terminals for amplifying a particle signal including serial pulses to output an output signal including the amplified serial pulses, a filter section for extracting a low frequency component from the output signal of the amplifier so that the extracted component is fed back into the input terminal as a negative feedback signal, and a feedback signal control section for allowing the filter section to fix the negative feedback signal when each of the amplified pulses rises and to hold the fixed negative feedback signal while the amplified pulse is larger than a threshold value.

Claims

1. A particle signal processing apparatus which processes a particle signal representative of characteristics of particles, comprising:

an amplifier having input and output terminals for amplifying a particle signal including serial pulses to output an output signal including the amplified serial pulses;

a filter section for extracting a low frequency component from the output signal of the amplifier so that the extracted component is fed back into the input terminal as a negative feedback signal; and

a feedback signal control section for allowing the filter section to fix the negative feedback signal when each of the amplified pulses rises and to hold the fixed negative feedback signal while the amplified pulse is larger than a threshold value.

2. The particle signal processing apparatus of

claim 1

wherein the filter section comprises an RC active filter composed of an operational amplifier, a capacitor and three resistors.

3. The particle signal processing apparatus of

claim 1

wherein the feedback signal control section comprises a comparator for comparing each amplified pulse with the threshold value and an analog switch which is actuated by an output signal of the comparator to fix the negative feedback signal output from the filter section.

4. The particle signal processing apparatus of

claim 3

wherein each amplified pulse is inputted to the comparator through a differential circuit to emphasis a rise of each amplified pulse.

5. A particle measurement apparatus comprising:

a detection section having a pair of electrodes with an orifice section therebetween for detecting a change in impedance between the electrodes as a particle signal when a liquid containing particles passes through the orifice;

a particle signal processing apparatus defined by

claim 1

; and

a analysis section for analyzing the particle signal processed by the particle signal processing apparatus.

6. The particle measurement apparatus of

claim 5

wherein the detecting section includes a flow cell, a power source and a converting section, the flow cell having first and second chambers, one electrode and the other electrode being positioned in the first and second chambers, respectively, the power source supplying an d.c. current between the pair of electrodes, the converting section converting a current corresponding to the change in impedance into a voltage corresponding to the particle signal.