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CHIP-ON-CHIP TESTING USING BIST

  • US 20010050573A1
  • Filed: 04/07/1999
  • Published: 12/13/2001
  • Est. Priority Date: 04/07/1999
  • Status: Active Grant
First Claim
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1. An integrated circuit having a primary IC chip and a secondary IC chip electrically connected to each other, said primary IC comprising:

  • an auxiliary built-in-self-test (BIST) circuit for testing said secondary IC.

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  • 9 Assignments
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