Height scanning interferometer for determining the absolute position and surface profile of an object with respect to a datum
First Claim
1. A surface profiling method for determining the relative positions of multiple points on an object surface including multiple surface materials, the method comprising:
- collecting interferometric data related to the relative positions; and
calculating the relative positions based on the collected interferometric data and at least one value indicative of dispersion in the phase change on reflection (PCOR) for each of the surface materials.
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Abstract
The invention features a surface profiling method including: collecting interferometric data related to a surface profile of a measurement object; and calculating the surface profile based on the collected interferometric data and at least one value indicative of dispersion in the phase change on reflection (PCOR) of the profiled surface of the measurement object. The invention also features a surface profiling system including: an interferometry system which during operation provides interferometric data related to a surface profile of a measurement object; and an electronic processor coupled the interferometry system, wherein during operation the electronic processor calculates the surface profile based on the interferometric data and at least one parameter indicative of dispersion in the phase change on reflection (PCOR) of the profiled surface of the measurement object.
9 Citations
30 Claims
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1. A surface profiling method for determining the relative positions of multiple points on an object surface including multiple surface materials, the method comprising:
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collecting interferometric data related to the relative positions; and
calculating the relative positions based on the collected interferometric data and at least one value indicative of dispersion in the phase change on reflection (PCOR) for each of the surface materials.
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2. A surface profiling method for determining the relative positions of multiple points on an object surface including multiple surface materials, the method comprising:
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collecting interferometric data related to the relative positions; and
calculating the relative positions based on the collected interferometric data and at least one value indicative of the phase change on reflection (PCOR) γ
part for each of the surface materials.
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3. A surface profiling method for determining the absolute position with respect to a common datum surface of each of multiple points on an object surface, the method comprising:
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collecting interferometric data related to the absolute positions; and
calculating the absolute positions based on the collected interferometric data and at least one value indicative of dispersion in the phase change on reflection (PCOR) of the object surface and dispersion in the phase change on reflection (PCOR) of an interferometry system used to collect the interferometric data.
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4. A surface profiling method for determining the absolute position with respect to a common datum surface of each of multiple points on an object surface, the method comprising:
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collecting interferometric data related to the absolute positions; and
calculating the absolute positions based on the collected interferometric data and at least one value indicative of the phase change on reflection (PCOR) of the object surface γ
part and the phase change on reflection (PCOR) of an interferometry system used to collect the interferometric data γ
sys.
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5. A surface profiling method comprising:
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collecting interferometric data related to a surface profile of a measurement object; and
calculating the surface profile based on the collected interferometric data and at least one value indicative of dispersion in the phase change on reflection (PCOR) of the profiled surface of the measurement object. - View Dependent Claims (6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
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20. A surface profiling system comprising:
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an interferometry system which during operation provides interferometric data related to a surface profile of a measurement object; and
an electronic processor coupled the interferometry system, wherein during operation the electronic processor calculates the surface profile based on the interferometric data and at least one parameter indicative of dispersion in the phase change on reflection (PCOR) of the profiled surface of the measurement object. - View Dependent Claims (21, 22, 23)
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24. A method for calibrating an interferometry system to determine at least one of the phase change on reflection (PCOR) of the interferometry system γ
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sys, and linear dispersion of the phase change of reflection (PCOR) of the interferometry system τ
sys with respect to a reference wavevector k0, the method comprising;
collecting interferometric data relating to a test surface using the interferometry system;
providing independent information for the profile h of the test surface, the phase change on reflection (PCOR) of the test surface γ
part, and the linear dispersion of the phase change on reflection (PCOR) of the test surface τ
part with respect to a reference wavevector k0; and
calculating the at least one of the phase change on reflection (PCOR) of the interferometry system γ
sys and the linear dispersion of the phase change of reflection (PCOR) of the interferometry system τ
sys based on the interferometric data and the independent information. - View Dependent Claims (25, 26, 27, 28)
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sys, and linear dispersion of the phase change of reflection (PCOR) of the interferometry system τ
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29. A method for measuring at least one of the phase change on reflection (PCOR) of test material γ
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part and linear dispersion of the phase change of reflection (PCOR) of the test material τ
part with respect to a reference wavevector k0, the method comprising;
collecting interferometric data relating to a test surface using an interferometry system;
providing independent information for the phase change on reflection (PCOR) of the interferometry system γ
sys and the linear dispersion of the phase change on reflection (PCOR) of the interferometry system τ
sys with respect to a reference wavevector k0; and
calculating the at least one of the phase change on reflection (PCOR) of the test material γ
part and the linear dispersion of the phase change of reflection (PCOR) of the test material τ
part based on the interferometric data and the independent information. - View Dependent Claims (30)
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part and linear dispersion of the phase change of reflection (PCOR) of the test material τ
Specification