Exposure method and exposure apparatus

• US 20010055733A1
• Filed: 04/09/2001
• Published: 12/27/2001
• Est. Priority Date: 04/11/2000
• Status: Abandoned Application

• Current Assignee: Nikon Corporation
• Original Assignee: Nikon Corporation
• Inventors: Irie, Nobuyuki, Magome, Nobutaka
• Application Number:
  US09/827,946
• Publication Number:
  US 20010055733A1
• Time in Patent Office: Days
• US Class Current: 430/396
• CPC Class Codes: G03F 7/201 characterised by an oblique exposure; characterised by the use of plural sources; characterised by the rotation of the optical device; characterised by a relative movement of the optical device, the light source, the sensitive system or the mask
• CPC Class Codes: G03F 7/70066 Size and form of the illuminated area in the mask plane, e.g. reticle masking blades or blinds
• CPC Class Codes: G03F 7/70191 Optical correction elements, filters or phase plates for controlling intensity, wavelength, polarisation, phase or the like
• CPC Class Codes: G03F 7/70358 Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging

Abstract

An exposure method which irradiates a slit-shaped illumination light IL on a reticle Ri and a substrate while moving them synchronously so as to sequentially transfer images of patterns formed on the reticle Ri to the substrate 4, wherein a density filter Fj having an attenuating part for gradually reducing the distribution of illuminance of the illumination light IL is moved in synchronization with the movement of the reticle Ri.

Claims

1. An exposure method which irradiates a slit-shaped energy beam on a mask and a sensitive object while moving them synchronously so as to sequentially transfer images of patterns formed on the mask to the sensitive object, including

a step of moving a density filter having a attenuating part for gradually reducing an amount of energy of the energy beam in sychronization with the movement of the mask.

2. An exposure method as set forth in

claim 1

, wherein a light-blocking member able to advance into and retract from said energy beam is moved in synchronization with movement of said density filter.

3. An exposure method as set forth in

claim 2

, wherein said light-blocking member is moved in a state positioned to block part of the density filter.

4. An exposure method as set forth in

claim 1

, wherein part of said attenuating part is selectively blocked by a light-blocking member able to advance into and retract from said energy beam.

5. An exposure method as set forth in

claim 1

, wherein different areas on said sensitive object are irradiated by said energy beam for seamless exposure such that parts irradiated by said energy beam on said sensitive object through said attenuating part overlap as stitched parts.

6. An exposure method as set forth in

claim 5

, wherein different areas on said sensitive object in a direction along a direction of movement of said sensitive object are irradiated by said energy beam.

7. An exposure method as set forth in

claim 6

, wherein different areas on said sensitive object in a direction perpendicular to said direction of movement are irradiated by said energy beam.

8. An exposure method as set forth in

claim 5

, wherein a pattern obtained by enlarging a pattern for transfer is partitioned into patterns of a plurality of masks and images of said masks reduced by a projection optical system are successively transferred to a plurality of areas on said sensitive object with partially overlapping peripheral parts.

16. A photomask produced using the exposure method of

claim 1

or

claim 9

.

17. A method of manufacture of a device including a step of transferring a pattern for transfer to a device substrate using a photomask of

claim 16

.

9. An exposure method which relatively moves a mask and a sensitive object with respect to an energy beam and scans and exposes the sensitive object by the energy beam through the mask, including

a step of gradually reducing an amount of energy in a part of an area irradiated by the energy beam on the sensitive object in a first direction in which the sensitive object is moved, while relatively moving a slope part where the amount of energy is gradually reduced in the first direction in said irradiated area during the scan exposure.

10. An exposure method as set forth in

claim 9

, wherein the slope part is moved in a state of corresponding substantially with a part to which an amount of exposure energy in the first direction of a predetermined area by which scan exposure is carried out on the sensitive object reduces.

11. An exposure method as set forth in

claim 9

, wherein the slope part is moved in a state of corresponding substantially with a part of a predetermined area, which partially overlaps an area adjacent to the predetermined area in the first direction.

12. An exposure method as set forth in

claim 9

, wherein a density filter having an attenuating part for forming the slope part is made to relatively move with respect to said energy beam in accordance with movement of said mask.

13. An exposure method as set forth in

claim 12

, wherein a relative positional relationship between a blocking member for blocking said energy beam and said density filter is adjusted before the scan exposure.

14. An exposure method as set forth in

claim 9

, wherein the slope part is moved relatively in the first direction in the irradiated area when scanning and exposing at least two areas arranged in the first direction out of a plurality of areas for transferring patterns to the plurality of areas on the sensitive object with partially overlapping peripheral parts by a step-and-stitch system.

15. An exposure method as set forth in

claim 14

, wherein the amount of energy in the irradiated area is made to be gradually reduced relative to a second direction perpendicular to the first direction in order to scan and expose at least two areas aligned in the second direction out of said plurality of areas.

18. An exposure apparatus which irradiates a slit-shaped energy beam on a mask and a sensitive object while moving them synchronously so as to sequentially transfer images of patterns formed on the mask to the sensitive object, comprising

a density filter which adjusts the distribution of energy of the energy beam and

a filter stage which moves the density filter in synchronization with the mask.

34. A method of manufacture of a photomask including a step of transferring a plurality of patterns an a mask substrate by a step-and-stitch method using an exposure apparatus of

claim 18

,

19

, or 21.

35. A method of manufacture of a photomask as set forth in

claim 34

, where said plurality of patterns are obtained by partitioning an enlarged pattern of a device pattern to be formed on the photomask into a plurality of patterns and wherein images of them reduced by a projection optical system are transferred on a plurality of areas partially overlapping at their peripheral parts on the mask substrate.

19. An exposure apparatus comprising:

a mask stage which moves a mask,

a substrate stage which moves a substrate,

an illumination optical system which irradiates a slit-shaped energy beam,

a filter stage which moves a density filter having an attenuating part for gradually reducing an amount of energy of said energy beam and

a controller which controls said mask stage, said substrate stage, and said filter stage so that said substrate and said density filter move synchronously with respect to said energy beam.

20. An exposure apparatus as set forth in

claim 19

, further comprising

a blind mechanism having a light-blocking member able to advance and retract in a direction along the direction of movement of the mask,

said controller controlling the blind mechanism so that said light-blocking member moves synchronously with said density filter in a state maintaining a predetermined positional relationship with said density filter.

21. An exposure apparatus which relatively moves a mask and a sensitive object with respect to an energy bean and scans and exposes the sensitive object by the energy beam through the mask, comprising:

a density filter which gradually reduces an amount of energy in a part of an area irradiated by the energy beam on the sensitive object in a first direction in which the sensitive object is moved and

an adjuster which shifts a slope part where the amount of energy is gradually reduced in the first direction in said irradiated area during the scan exposure.

22. An exposure apparatus as set forth in

claim 21

, wherein said adjuster includes a drive mechanism which moves said density filter relative to said energy beam in accordance with movement of said mask.

23. An exposure apparatus as set forth in

claim 21

, wherein at least two areas on said sensitive object with partially overlapped peripheral parts and aligned in said first direction are scanned and exposed for transferring patterns on said at least two areas by the step-and-stitch system.

24. An exposure apparatus as set forth in claim 23, wherein said density filter gradually reduces the amount of energy in said irradiated area at an end in said second direction so as to scan and expose at least two areas which partially overlap at their peripheral parts on the sensitive object and are aligned in a second direction perpendicular to said first direction.

25. An exposure apparatus in which a mask and a sensitive object are moved relative to an energy beam and the sensitive object is scanned exposed by the energy beam through the mask, comprising:

a first optical unit which defines the width of an area irradiated by the energy beam on the sensitive object in a first direction in which the sensitive object is moved during the scan exposure; and

a second optical unit which gradually reduces an amount of energy in a part of the irradiated area in the first direction, while shifting a slope part which the amount of energy is gradually reduced in the first direction within the irradiated area during the scan exposure.

26. An exposure apparatus as set forth in

claim 25

, wherein the second optical unit shifts the slope part in a state of corresponding substantially with a part which an amount of exposure energy in the first direction of a predetermined area by which scan exposure is carried out on the sensitive object reduces.

27. An exposure apparatus as set forth in

claim 25

, wherein the second optical unit shifts the slope part in a state of corresponding substantially with a part of a predetermined area, which partially overlaps an area adjacent to the predetermined area in the first direction.

28. An exposure apparatus as set forth in

claim 25

, wherein the second optical unit includes a density filter having an attenuating part for forming the slope part and the density filter is shifted synchronously with movement of the mask and the sensitive object.

29. An exposure apparatus as set forth in

claim 28

, wherein the first optical unit includes a stop member having an opening width thereof fixed in the first direction and the density filter has a light shielding part formed adjacent to the attenuating part in the first direction and whose width is equal to or larger than the opening width of the stop member.

30. An exposure apparatus as met forth in

claim 28

, wherein the first optical unit includes a movable stop member which prevents an area outside the slope from being irradiated with the energy beam in the first direction in the irradiated area and at least a part of the movable stop member is moved in accordance with movement of the density filter.

31. An exposure apparatus as set forth in

claim 30

, wherein the first optical unit includes a stop member different from the movable stop member and having a fixed opening width in the first direction.

32. An exposure apparatus as set forth in

claim 28

, wherein the density filter gradually decreases the amount of energy at the end of the irradiated area in a second direction perpendicular to the first direction.

33. An exposure apparatus as set forth in

claim 25

, wherein the first optical unit gradually reduces the amount of energy at the end of the irradiated area in the first direction.