Arrangement for spectrally sensitive reflected-light and transmitted-light microscopy

• US 20020005982A1
• Filed: 01/11/2001
• Published: 01/17/2002
• Est. Priority Date: 07/17/2000
• Status: Abandoned Application

• Current Assignee: Leica Microsystems Heidelberg GmbH (Danaher Corporation)
• Original Assignee: Leica Microsystems Heidelberg GmbH (Danaher Corporation)
• Inventors: Borlinghaus, Rolf
• Application Number:
  US09/758,673
• Publication Number:
  US 20020005982A1
• Time in Patent Office: Days
• US Class Current: 359/385
• CPC Class Codes: G02B 21/088 for both incident illumination and transillumination

Abstract

The arrangement for spectrally sensitive reflected-light and transmitted-light microscopy comprises an illuminating device which illuminates a sample under study in two dimensions. A scanning device is provided which respectively directs the light emanating from a detection region of the sample under study onto a multiband detector. In one embodiment, the illuminating device is arranged in such a way that it transilluminates the sample in two dimensions. In a further embodiment, the illuminating device illuminates the sample in two dimensions in reflected light.

Claims

1. Arrangement for spectrally sensitive reflected-light and transmitted-light spectroscopy, comprising an illuminating device (1) for illuminating at least one region of a sample (4) in two dimensions, a scanning device (6) which defines a detection region in the sample and a multiband detector (7) which receives the light emanating from the detection region of the sample in temporal sequence wherein the light is directed by the scanning device (6).

2. The arrangement according to claim 1, characterized in that the illuminating device (1) transilluminates the sample (4) in two dimensions.

3. The arrangement according to claim 1, characterized in that the illuminating device (1) illuminates the sample (4) in two dimensions in reflected light.

4. The arrangement according to claim 1, characterized in that a pinhole is provided upstream of the multiband detector (7), the detection region being smaller than the pinhole.

5. The arrangement according to claim 2, characterized in that the multiband detector (7) records at least two data records of the sample (4) of different spectral compositions.

6. The arrangement according to claim 5, characterized in that the multiband detector (7) constitutes a slit/detector arrangement.

7. The arrangement according to claim 5, characterized in that the multiband detector (7) is formed by at least one dichroic beam splitter (9, 10) which directs the light onto an assigned detector (11, 12, 13) in accordance with the filter properties.

8. The arrangement according to claim 1, characterized in that the scanning device (6) rasterizes the region of the sample (4) in such a way that the light from the plurality of detection regions, which are substantially smaller than the region of the sample (4), passes into the multiband detector (7) sequentially.