Circuit for machine-vision system
First Claim
1. A machine-vision system for inspecting a device, said machine-vision system comprising:
- a light source for propagating light to the device;
an image detector that receives light from the device;
a light sensor assembly receiving a portion of the light from the light source, said light sensor assembly producing an output responsive to the intensity of the light received at the light sensor assembly; and
a controller for controlling the amount of light received by the image detector, said controller controlling the amount of light within a desired range in response to the output from the light sensor.
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Accused Products
Abstract
Manufacturing lines include inspection systems for monitoring the quality of parts produced. Manufacturing lines for making semiconductor devices generally inspect each fabricated part. The information obtained is used to fix manufacturing problems in the semiconductor fab plant. A machine-vision system for inspecting devices includes a light source for propagating light to the device and an image detector that receives light from the device. Also included is a light sensor assembly for receiving a portion of the light from the light source. The light sensor assembly produces an output signal responsive to the intensity of the light received at the light sensor assembly. A controller controls the amount of light received by the image detector to a desired intensity range in response to the output from the light sensor. The image detector may include an array of imaging pixels. The imaging system may also include a memory device which stores correction values for at least one of the pixels in the array of imaging pixels. To minimize or control thermal drift of signals output from an array of imaging pixels, the machine-vision system may also include a cooling element attached to the imaging device. The light source for propagating light to the device may be strobed. The image detector that receives light from the device remains in a fixed position with respect to the strobed light source. A translation element moves the strobed light source and image detector with respect to the device. The strobed light may be alternated between a first and second level.
118 Citations
39 Claims
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1. A machine-vision system for inspecting a device, said machine-vision system comprising:
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a light source for propagating light to the device;
an image detector that receives light from the device;
a light sensor assembly receiving a portion of the light from the light source, said light sensor assembly producing an output responsive to the intensity of the light received at the light sensor assembly; and
a controller for controlling the amount of light received by the image detector, said controller controlling the amount of light within a desired range in response to the output from the light sensor. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A machine-vision system for inspecting a device, said machine-vision system comprising:
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a light source for propagating light to the device;
an image detector that receives light from the device; and
a cooling element attached to said imaging device, said cooling element removing heat produced by the image detector to keep the image detector within a selected temperature range. - View Dependent Claims (11, 12, 13, 15, 16, 17, 18, 19, 20, 21, 22, 23, 25, 26, 27, 28, 30)
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14. A machine-vision system for inspecting a device, said machine-vision system comprising:
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a strobed light source for propagating light to the device;
an image detector that receives light from the device, said image detector remaining in a fixed position with respect to the strobed light source; and
translation element that moves the strobed light source and image detector with respect to the device.
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24. A method for acquiring physical information associated with of a device using a machine-vision station having a light source and having an image detector, said method comprising the steps of:
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projecting light from the light source to the device;
receiving light reflected from the device into an image detector; and
controlling the amount of light received at the image detector to a value within a desired range.
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29. A method for acquiring physical information associated with of a device using a machine-vision station having a light source and having an image detector, said method comprising the steps of:
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projecting light from the light source to the device;
receiving light reflected from the device into an image detector; and
removing heat produced by the image detector to keep the image detector within a selected temperature range.
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31. A method for acquiring physical information associated with of a device using a machine-vision station having a light source and having an image detector, said method comprising the steps of:
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fixing the relationship between the light source and the image detector;
moving the light source and the image detector with respect to the device;
projecting strobed light from the light source to the device; and
receiving light reflected from the device into an image detector. - View Dependent Claims (32, 33, 34, 36, 37, 38, 39)
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35. A manufacturing system, comprising:
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a semiconductor part fabrication unit that fabricates a part for a semiconductor device; and
an inspection station, the inspection station further comprising;
(a) a light source projecting light onto the device;
(b) an image detector which receives light reflected from the device, the image detector including a plurality of lines of semiconductor imaging pixels;
(c) a light sensor assembly receiving a portion of the light from the light source, said light sensor assembly producing an output responsive to the intensity of the light received at the light sensor assembly; and
(d) a controller for controlling the amount of light received by the image detector, said controller controlling the amount of light within a desired range in response to the output from the light sensor.
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Specification